From mboxrd@z Thu Jan 1 00:00:00 1970 From: Eryu Guan Date: Wed, 14 Jun 2017 19:16:10 +0800 Subject: [LTP] [PATCH] dio: reduce the number of cycles In-Reply-To: <20170614033830.12736-1-liwang@redhat.com> References: <20170614033830.12736-1-liwang@redhat.com> Message-ID: <20170614111610.GC17436@eguan.usersys.redhat.com> List-Id: MIME-Version: 1.0 Content-Type: text/plain; charset="us-ascii" Content-Transfer-Encoding: 7bit To: ltp@lists.linux.it On Wed, Jun 14, 2017 at 11:38:30AM +0800, Li Wang wrote: > These two cases (dio29/30) takes a bit long time in dio test, but they're not stress > test, so I suggest reducing the number of cycles. > > On my RHEL-7.3 (23G RAM, 24 CPU(s), x86_64) box, it takes almost 9 mins. > > diotest06 1 TPASS : Read with Direct IO, Write without > diotest06 2 TPASS : Write with Direct IO, Read without > diotest06 3 TPASS : Read, Write with Direct IO > diotest06 0 TINFO : 3 testblocks 1000 iterations with 100 children completed > > real 8m4.805s > user 71m36.722s > sys 8m51.649s > > Signed-off-by: Li Wang I tested diotest30 with 100 iterations and it still could reproduce the bug I was seeing on 4.10 kernel quite reliably (even if not 100%), so Acked-by: Eryu Guan > --- > runtest/dio | 4 ++-- > 1 file changed, 2 insertions(+), 2 deletions(-) > > diff --git a/runtest/dio b/runtest/dio > index a26e001..185cd57 100644 > --- a/runtest/dio > +++ b/runtest/dio > @@ -40,8 +40,8 @@ dio27 diotest6 -b 8192 -o 1024000 -i 1000 -v 100 > dio28 diotest6 -b 8192 -o 1024000 -i 1000 -v 200 > > ### Run the tests with more children > -dio29 diotest3 -b 65536 -n 100 -i 1000 -o 1024000 > -dio30 diotest6 -b 65536 -n 100 -i 1000 -o 1024000 > +dio29 diotest3 -b 65536 -n 100 -i 100 -o 1024000 > +dio30 diotest6 -b 65536 -n 100 -i 100 -o 1024000 > # > # RAW DEVICE TEST SECTION > # DEV1 and DEV2 should be exported prior to execution or > -- > 2.9.3 >