Re: [PATCH v13 07/12] iio: test: iio-test-format: add test case for decimal format

[sashiko-bot@kernel.org]

Thank you for your contribution! Sashiko AI review found 1 potential issue(s) to consider:
- [Medium] The commit message references a non-existent macro `iio_val_s64_array_populate()` instead of `iio_val_s64_to_s32s()`.
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commit 193968c85cf343f53a134b72d9051e73bf8ed534
Author: Rodrigo Alencar <rodrigo.alencar@analog.com>

iio: test: iio-test-format: add test case for decimal format

This commit adds a new kunit test case for decimal value formatting
using different scale types. It also refactors the integer 64 test to
use a helper function for populating the values array.

> Add iio_test_iio_format_value_decimal_64() kunit test case for decimal
> value formatting, exploring different scales types. Also, the same
> iio_val_s64_array_populate() macro used to populate local array is used in
> iio_test_iio_format_value_integer_64().

This isn't a bug, but the commit message references a macro named
iio_val_s64_array_populate(). The submitted code actually uses the inline
function iio_val_s64_to_s32s().

Could the commit message be updated to reference the correct function name?

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Sashiko AI review · https://sashiko.dev/#/patchset/20260517-adf41513-iio-driver-v13-0-bb6e134a360f@analog.com?part=7