Re: [Qemu-devel] [PATCH RFC 0/1] qtest: Generic PCI device test

["Andreas Färber" <afaerber@suse.de>]

Hi Markus,

Again thanks for digging into this.

Am 29.01.2015 um 15:58 schrieb Markus Armbruster:
> This test does everything a number of existing tests currently do:
> 
>     ac97-test.c e1000-test.c es1370-test.c eepro100-test.c
>     ne2000-test.c nvme-test.c pcnet-test.c rtl8139-test.c
>     tpci200-test.c virtio-balloon-test.c virtio-rng-test.c
>     vmxnet3-test.c
> 
> They are all marked "TODO: Replace with functional tests".  Options
> 
> * Delete them now, undelete when we add functional tests
> 
> * Keep them, blacklist the devices in pci-devs-test.c
> 
> * Live with the duplicated testing
> 
> Andreas, I guess you got an opinion here.

My preference would be to not remove device files. "Functional tests"
refers to doing real device-specific MMIO or PIO, and the intent of
contributing such stubs, beyond the basic -device init/realize testing,
was lowering the hurdle so that maintainers can require bugfixers to
contribute a matching test case where applicable.

> There's overlap with a few others:
> 
>     i82801b11-test.c usb-hcd-ehci-test.c usb-hcd-ohci-test.c
>     usb-hcd-xhci-test.c virtio-blk-test.c virtio-net-test.c
>     virtio-scsi-test.c virtio-serial-test.c
> 
> Options:
> 
> * Blacklist the devices in pci-devs-test.c
> 
> * Live with the duplicated testing
> 
> Andreas?

Not having reviewed the respective test code yet, I would suggest to
keep generic tests in pci-devs-test.c and to rather drop generic tests
from device-specific files (de-duplication).

While I haven't benchmarked it, I assume that the bigger contributor to
qtest runtime is the overhead of spawning qemu-system-* processes rather
than running multiple tests per process. So living with duplication may
be a convenience option.

Regards,
Andreas

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