Re: [PATCH v7 7/7] hw/cxl/events: Add injection of Memory Module Events

[Markus Armbruster <armbru@redhat.com>]

Jonathan Cameron <Jonathan.Cameron@huawei.com> writes:

> These events include a copy of the device health information at the
> time of the event. Actually using the emulated device health would
> require a lot of controls to manipulate that state.  Given the aim
> of this injection code is to just test the flows when events occur,
> inject the contents of the device health state as well.
>
> Future work may add more sophisticate device health emulation
> including direct generation of these records when events occur
> (such as a temperature threshold being crossed).  That does not
> reduce the usefulness of this more basic generation of the events.
>
> Reviewed-by: Ira Weiny <ira.weiny@intel.com>
> Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
>
> ---
> v7: Expanded docs for qapi and added a lot of cross references to
>     the CXL revision 3.0 specification.
> ---
>  qapi/cxl.json               | 54 ++++++++++++++++++++++++++++++++
>  include/hw/cxl/cxl_events.h | 19 ++++++++++++
>  hw/mem/cxl_type3.c          | 62 +++++++++++++++++++++++++++++++++++++
>  hw/mem/cxl_type3_stubs.c    | 12 +++++++
>  4 files changed, 147 insertions(+)
>
> diff --git a/qapi/cxl.json b/qapi/cxl.json
> index ce9adcbc55..05c560cfe5 100644
> --- a/qapi/cxl.json
> +++ b/qapi/cxl.json
> @@ -147,6 +147,60 @@
>              '*column': 'uint16', '*correction-mask': [ 'uint64' ]
>             }}
>  
> +##
> +# @cxl-inject-memory-module-event:
> +#
> +# Inject an event record for a Memory Module Event (CXL r3.0
> +# 8.2.9.2.1.3). # This event includes a copy of the Device Health

Stray '#'.

> +# info at the time of the event.
> +#
> +# @path: CXL type 3 device canonical QOM path
> +#
> +# @log: Event Log to add the event to
> +#
> +# @flags: Event Record Flags. See CXL r3.0 Table 8-42 Common Event
> +#         Record Format, Event Record Flags for subfield definitions.
> +#
> +# @type: Device Event Type. See CXL r3.0 Table 8-45 Memory Module
> +#        Event Record for bit definitions for bit definiions.
> +#
> +# @health-status: Overall health summary bitmap. See CXL r3.0 Table
> +#                 8-100 Get Health Info Output Payload, Health Status
> +#                 for bit definitions.
> +#
> +# @media-status: Overall media health summary. See CXL r3.0 Table
> +#                8-100 Get Health Info Output Payload, Media Status
> +#                for bit definitions.
> +#
> +# @additional-status: See CXL r3.0 Table 8-100 Get Health Info Output
> +#                     Payload, Additional Status for subfield
> +#                     definitions.
> +#
> +# @life-used: Percentage (0-100) of factory expected life span.
> +#
> +# @temperature: Device temperature in degrees Celsius.
> +#
> +# @dirty-shutdown-count: Number of time the device has been unable to

Number of times

> +#                        determine whether data loss may have occurred.
> +#
> +# @corrected-volatile-error-count: Total number of correctable errors in
> +#                                  volatile memory.
> +#
> +# @corrected-persistent-error-count: Total number correctable errors in
> +#                                    persistent memory

Please format like

   # @flags: Event Record Flags.  See CXL r3.0 Table 8-42 Common Event
   #     Record Format, Event Record Flags for subfield definitions.
   #
   # @type: Device Event Type.  See CXL r3.0 Table 8-45 Memory Module
   #     Event Record for bit definitions for bit definiions.
   #
   # @health-status: Overall health summary bitmap.  See CXL r3.0 Table
   #     8-100 Get Health Info Output Payload, Health Status for bit
   #     definitions.
   #
   # @media-status: Overall media health summary.  See CXL r3.0 Table
   #     8-100 Get Health Info Output Payload, Media Status for bit
   #     definitions.
   #
   # @additional-status: See CXL r3.0 Table 8-100 Get Health Info Output
   #     Payload, Additional Status for subfield definitions.
   #
   # @life-used: Percentage (0-100) of factory expected life span.
   #
   # @temperature: Device temperature in degrees Celsius.
   #
   # @dirty-shutdown-count: Number of time the device has been unable to
   #     determine whether data loss may have occurred.
   #
   # @corrected-volatile-error-count: Total number of correctable errors
   #     in volatile memory.
   #
   # @corrected-persistent-error-count: Total number correctable errors
   #     in persistent memory

to blend in with recent commit a937b6aa739 (qapi: Reformat doc comments
to conform to current conventions).


> +#
> +# Since: 8.1
> +##
> +{ 'command': 'cxl-inject-memory-module-event',
> +  'data': { 'path': 'str', 'log': 'CxlEventLog', 'flags' : 'uint8',
> +            'type': 'uint8', 'health-status': 'uint8',
> +            'media-status': 'uint8', 'additional-status': 'uint8',
> +            'life-used': 'uint8', 'temperature' : 'int16',
> +            'dirty-shutdown-count': 'uint32',
> +            'corrected-volatile-error-count': 'uint32',
> +            'corrected-persistent-error-count': 'uint32'
> +            }}
> +
>  ##
>  # @cxl-inject-poison:
>  #

With these tweaks
Acked-by: Markus Armbruster <armbru@redhat.com>

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