Re: [PATCH RFC v2 0/3] dt-bindings: iio: adc: Add reference, excitation and burn-out properties

["Kurt Borja" <kuurtb@gmail.com>]

On Mon Jun 22, 2026 at 2:38 PM -05, David Lechner wrote:
> On 6/22/26 2:30 PM, Kurt Borja wrote:
>> Hi all,
>> 
>> After submitting a patch series adding support for TI ADS126X ADCs [1],
>> I was made aware by David [2] that at least two more chip families,
>> ads1220 [3] and ads1x2c14, share very similar features (though these
>> chips are not really compatible between them). After that, I found one
>> more chip with the same features which is already upstream, the
>> AD4170-4.
>> 
>> As David explained in [2], these chips are intended to be used with
>> RTDs, thermocouples or other resistive sensors so they share the
>> following per-channel features:
>> 
>>   - Configurable reference selection
>>   - Burn-out Current Sources (BOCS) for diagnostic purpuses
>>   - Excitation current sources (usually called IDACs TI) for sensor
>>     current biasing
>> 
>> Given that these three features are present in all four devices and
>> three of these drivers are still under review, my proposal is to have
>> these features be described in adc.yaml and have this series merged
>> before the three others [1] [2] [3].
>> 
>> This series is sent as RFC because I still don't have much experience
>> with dt-bindings and I don't know if this approach or the properties are
>> general enough to be described like this.
>
> It will probably be easier if I just include these patches when I do
> v2 of my series (if you don't mind me tweaking them a bit).

Sure, that's fine by me. I'll add a dependency to your series with b4.

Want me to send one more version addressing your comments before you
take it in?

-- 
Thanks,
 ~ Kurt