Re: [dpdk-dev] [PATCH v3 4/4] test: change external memory test to use system page sz

[Nithin Dabilpuram <nithind1988@gmail.com>]

On Tue, Dec 01, 2020 at 03:23:39PM -0800, David Christensen wrote:
> > diff --git a/app/test/test_external_mem.c b/app/test/test_external_mem.c
> > index 7eb81f6..67690c6 100644
> > --- a/app/test/test_external_mem.c
> > +++ b/app/test/test_external_mem.c
> > @@ -532,8 +532,8 @@ test_extmem_basic(void *addr, size_t len, size_t pgsz, rte_iova_t *iova,
> >   static int
> >   test_external_mem(void)
> >   {
> > +	size_t pgsz = rte_mem_page_size();
> 
> I'm seeing a build warning with this code.  Looks like you need:
> 
> #include <rte_eal_paging.h>

Ack, will fix it in v4. Missed to test this series with x86 but just tested with
arm64.

Thanks.
> 
> Dave