Re: [PATCH v7 0/8] selftests/cgroup: improve zswap tests robustness and support large page sizes

["Michal Koutný" <mkoutny@suse.com>]

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On Fri, Apr 24, 2026 at 12:00:51PM +0800, Li Wang <li.wang@linux.dev> wrote:
> This patchset aims to fix various spurious failures and improve the overall
> robustness of the cgroup zswap selftests.
> 
> The primary motivation is to make the tests compatible with architectures
> that use non-4K page sizes (such as 64K on ppc64le and arm64). Currently,
> the tests rely heavily on hardcoded 4K page sizes and fixed memory limits.
> On 64K page size systems, these hardcoded values lead to sub-page granularity
> accesses, incorrect page count calculations, and insufficient memory pressure
> to trigger zswap writeback, ultimately causing the tests to fail.
> 
> Additionally, this series addresses OOM kills occurring in test_swapin_nozswap
> by dynamically scaling memory limits, and prevents spurious test failures
> when zswap is built into the kernel but globally disabled.
> 
> Changes in v7:
>   Replace my work email by li.wang@linux.dev address.
>   Add Acked-by: Nhat Pham <nphamcs@gmail.com> to series.
>   Rebase to the latest branch (only one tiny conflict resolved).

I think the patches from the series where I had no special remarks can
be applied already (and base next (smaller) series on that).

Michal

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