smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus family Device Model: ST3160827AS Serial Number: 4MT03YDP Firmware Version: 3.42 User Capacity: 160 041 885 696 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 6 ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2 Local Time is: Tue May 16 09:28:59 2006 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 430) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 94) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 058 050 006 Pre-fail Always - 169809676 3 Spin_Up_Time 0x0003 097 096 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 49 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 085 060 030 Pre-fail Always - 382911082 9 Power_On_Hours 0x0032 094 094 000 Old_age Always - 5262 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 51 194 Temperature_Celsius 0x0022 041 047 000 Old_age Always - 41 (Lifetime Min/Max 0/11) 195 Hardware_ECC_Recovered 0x001a 058 050 000 Old_age Always - 169809676 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 001 000 Old_age Always - 5440 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0 202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 5599 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 5599 occurred at disk power-on lifetime: 5077 hours (211 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 cf 02 ae 86 e0 Error: ICRC, ABRT 207 sectors at LBA = 0x0086ae02 = 8826370 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 d1 ad 86 e0 00 00:33:30.108 READ DMA EXT 25 00 00 d1 ac 86 e0 00 00:33:30.107 READ DMA EXT 25 00 00 d1 ab 86 e0 00 00:33:29.130 READ DMA EXT 25 00 a8 29 ab 86 e0 00 00:33:28.210 READ DMA EXT 25 00 58 b9 aa 86 e0 00 00:33:28.208 READ DMA EXT Error 5598 occurred at disk power-on lifetime: 5077 hours (211 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 3f da 43 86 e0 Error: ICRC, ABRT 63 sectors at LBA = 0x008643da = 8799194 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 19 43 86 e0 00 00:31:21.906 READ DMA EXT 25 00 00 19 42 86 e0 00 00:31:20.351 READ DMA EXT 25 00 00 19 41 86 e0 00 00:31:19.440 READ DMA EXT 25 00 00 19 40 86 e0 00 00:31:18.419 READ DMA EXT 25 00 00 19 3f 86 e0 00 00:31:17.340 READ DMA EXT Error 5597 occurred at disk power-on lifetime: 5077 hours (211 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 90 cd 85 e0 Error: ICRC, ABRT at LBA = 0x0085cd90 = 8768912 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 91 cc 85 e0 00 00:29:24.155 READ DMA EXT 25 00 00 91 cb 85 e0 00 00:29:22.856 READ DMA EXT 25 00 00 91 ca 85 e0 00 00:29:21.664 READ DMA EXT 25 00 00 91 c9 85 e0 00 00:29:19.316 READ DMA EXT 25 00 00 91 c8 85 e0 00 00:29:17.567 READ DMA EXT Error 5596 occurred at disk power-on lifetime: 5077 hours (211 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 af da 1b 85 e0 Error: ICRC, ABRT 175 sectors at LBA = 0x00851bda = 8723418 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 89 1b 85 e0 00 00:25:45.560 READ DMA EXT 25 00 00 89 1a 85 e0 00 00:25:44.266 READ DMA EXT 25 00 00 89 19 85 e0 00 00:25:42.713 READ DMA EXT 25 00 00 89 18 85 e0 00 00:25:42.711 READ DMA EXT 25 00 00 89 17 85 e0 00 00:25:41.589 READ DMA EXT Error 5595 occurred at disk power-on lifetime: 5077 hours (211 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 ef 4a ea 83 e0 Error: ICRC, ABRT 239 sectors at LBA = 0x0083ea4a = 8645194 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 39 ea 83 e0 00 00:19:59.134 READ DMA EXT b0 d1 01 01 4f c2 00 00 00:20:03.728 SMART READ ATTRIBUTE THRESHOLDS [OBS-4] b0 d0 01 00 4f c2 00 00 00:20:03.078 SMART READ DATA b0 da 00 00 4f c2 00 00 00:20:03.006 SMART RETURN STATUS b0 da 00 00 4f c2 00 00 00:20:02.913 SMART RETURN STATUS SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 5088 - # 2 Short offline Completed without error 00% 5072 - # 3 Short offline Completed without error 00% 5043 - # 4 Short offline Completed without error 00% 5019 - # 5 Short offline Completed without error 00% 4995 - # 6 Extended offline Completed without error 00% 4974 - # 7 Short offline Completed without error 00% 4972 - # 8 Short offline Completed without error 00% 4948 - # 9 Short offline Completed without error 00% 4925 - #10 Short offline Completed without error 00% 4901 - #11 Short offline Completed without error 00% 4877 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.