From mboxrd@z Thu Jan 1 00:00:00 1970 From: Thomas Monjalon Subject: Re: [PATCH v2 0/4] DPDK memcpy optimization Date: Wed, 25 Feb 2015 11:46:44 +0100 Message-ID: <2838998.kCC4edMq5Z@xps13> References: <1422499127-11689-1-git-send-email-zhihong.wang@intel.com> Mime-Version: 1.0 Content-Type: text/plain; charset="us-ascii" Content-Transfer-Encoding: 7Bit Cc: dev-VfR2kkLFssw@public.gmane.org To: "Wang, Zhihong" , konstantin.ananyev-ral2JQCrhuEAvxtiuMwx3w@public.gmane.org Return-path: In-Reply-To: List-Id: patches and discussions about DPDK List-Unsubscribe: , List-Archive: List-Post: List-Help: List-Subscribe: , Errors-To: dev-bounces-VfR2kkLFssw@public.gmane.org Sender: "dev" > > This patch set optimizes memcpy for DPDK for both SSE and AVX platforms. > > It also extends memcpy test coverage with unaligned cases and more test > > points. > > > > Optimization techniques are summarized below: > > > > 1. Utilize full cache bandwidth > > > > 2. Enforce aligned stores > > > > 3. Apply load address alignment based on architecture features > > > > 4. Make load/store address available as early as possible > > > > 5. General optimization techniques like inlining, branch reducing, prefetch > > pattern access > > > > -------------- > > Changes in v2: > > > > 1. Reduced constant test cases in app/test/test_memcpy_perf.c for fast > > build > > > > 2. Modified macro definition for better code readability & safety > > > > Zhihong Wang (4): > > app/test: Disabled VTA for memcpy test in app/test/Makefile > > app/test: Removed unnecessary test cases in app/test/test_memcpy.c > > app/test: Extended test coverage in app/test/test_memcpy_perf.c > > lib/librte_eal: Optimized memcpy in arch/x86/rte_memcpy.h for both SSE > > and AVX platforms > > Acked-by: Pablo de Lara Applied, thanks for the great work! Note: we are still looking for a maintainer of x86 EAL.