Re: [RFC PATCH] check: try to fix the test device if it gets corrupted

Darrick J. Wong
2017-03-03T17:23:04Z

On Fri, Mar 03, 2017 at 05:03:32PM +0800, Eryu Guan wrote:
> On Thu, Mar 02, 2017 at 06:20:50PM -0500, Theodore Ts'o wrote:
> > If the test device gets corrupted all subsequent tests will fail. To
> > prevent this from causing all subsequent tests to be useless, try
> > repair the file system on TEST_DEV if possible. We don't need to do
> > this with the scratch device since that file system gets recreated
> > each time anyway.
> >
> > Signed-off-by: Theodore Ts'o <tytso@mit.edu>
> > ---
> >
> > This is a quick hack that I needed while debubgging some research
> > code[1]. It turns out that when the grad student is up against a
> > paper deadline is an, this becomes amazing evolutionary process which
> > creates file system modifications which are optimized for running
> > postmark and file bench --- and falls over very easily otherwise. So
> > when TEST_DEV is getting corrupted very frequently, it's nice to be
> > able to continue running other tests in the quick or auto group.
> >
> > So please consider this a proof-concept-patch; would people consider
> > it worthwhile to have this in xfstests upstream?
>
> This idea looks reasonable to me, and TEST_DEV is supposed to be aging,
> perhaps being currupted & repaired is kind of aging too :)

<shrug> The test device isn't supposed to get corrupted, since it (at
least in theory) should be an old filesystem. That said, I suppose
there's little point in banging around with a corrupt test fs. Maybe we
could go further and stop running if there's unfixable corruption?

--D

>
> Thanks,
> Eryu
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