Re: [RFC PATCH] fstests: Check if a fs can survive random (emulated) power loss

[Qu Wenruo <quwenruo.btrfs@gmx.com>]

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On 2018年02月26日 16:33, Amir Goldstein wrote:
> On Mon, Feb 26, 2018 at 10:20 AM, Qu Wenruo <quwenruo.btrfs@gmx.com> wrote:
>>
>>
>> On 2018年02月26日 16:15, Amir Goldstein wrote:
>>> On Mon, Feb 26, 2018 at 9:31 AM, Qu Wenruo <wqu@suse.com> wrote:
>>>> This test case is originally designed to expose unexpected corruption
>>>> for btrfs, where there are several reports about btrfs serious metadata
>>>> corruption after power loss.
>>>>
>>>> The test case itself will trigger heavy fsstress for the fs, and use
>>>> dm-flakey to emulate power loss by dropping all later writes.
>>>>
>>>
>>> Come on... dm-flakey is so 2016
>>> You should take Josef's fsstress+log-writes test and bring it to fstests:
>>> https://github.com/josefbacik/log-writes
>>>
>>> By doing that you will gain two very important features from the test:
>>>
>>> 1. Problems will be discovered much faster, because the test can run fsck
>>>     after every single block write has been replayed instead of just at random
>>>     times like in your test
>>
>> That's what exactly I want!!!
>>
>> Great thanks for this one! I would definitely look into this.
>> (Although the initial commit is even older than 2016)
>>
> 
> Please note that Josef's replay-individual-faster.sh script runs fsck
> every 1000 writes (i.e. --check 1000), so you can play with this argument
> in your test. Can also run --fsck every --check fua or --check flush, which
> may be more indicative of real world problems. not sure.
> 
>>
>> But the test itself could already expose something on EXT4, it still
>> makes some sense for ext4 developers as a verification test case.
>>
> 
> Please take a look at generic/456
> When generic/455 found a reproduciable problem in ext4,
> I created a specific test without any randomness to pin point the
> problem found (using dm-flakey).
> If the problem you found is reproduciable, then it will be easy for you
> to create a similar "bisected" test.

Yep, it's definitely needed for a pin-point test case, but I'm also
wondering if a random, stress test could also help.

Test case with plain fsstress is already super helpful to expose some
bugs, such stress test won't hurt.

Thanks,
Qu
> 
> Thanks,
> Amir.
> 


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