[igt-dev] [PATCH v5 0/2] Add a new test for driver/device hot reload

[Janusz Krzysztofik <janusz.krzysztofik@linux.intel.com>]

Janusz Krzysztofik (2):
  tests: Add a new test for driver/device hot reload
  tests/core_hot_reload: Accept external workload

 tests/Makefile.sources  |   1 +
 tests/core_hot_reload.c | 303 ++++++++++++++++++++++++++++++++++++++++
 tests/meson.build       |   1 +
 3 files changed, 305 insertions(+)
 create mode 100644 tests/core_hot_reload.c


Changelog:
v4->v5:
- move workload back from subtests to initial fixture and run it from
  an igt helper subprocess so workload crash does not affect test
  results and resources consumed by the workload are cleaned up
  automatically, also without affecting test results,
- re-add the second patch which extends the test with an option for
  using an external command as a workload.

v3->v4 (first public submission):
- run dummy_workolad from inside subtests,
- try to restore the device to a working state after each subtest.

v2->v3:
- run dummy_workload from the test process directly,
- drop the patch for running external workload.

v1->v2:
- run a subprocess with dummy_workload instead of external command,
- keep use of external workload command as an option, move that to a
  separate patch.
-- 
2.20.1

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