From: Janusz Krzysztofik <janusz.krzysztofik@linux.intel.com>
To: Arkadiusz Hiler <arkadiusz.hiler@intel.com>,
Petri Latvala <petri.latvala@intel.com>
Cc: igt-dev@lists.freedesktop.org, Daniel Vetter <daniel@ffwll.ch>
Subject: [igt-dev] [PATCH v7 0/2] Add a new test for driver/device hot reload
Date: Wed, 10 Apr 2019 12:02:24 +0200 [thread overview]
Message-ID: <20190410100226.20618-1-janusz.krzysztofik@linux.intel.com> (raw)
The test should help resolving driver bugs which exhibit themselves
when a device is unplugged / driver unbind from a device while the
device is busy (different from simple module unload which requires
device references being put first).
Janusz Krzysztofik (2):
tests: Add a new test for driver/device hot reload
tests/core_hot_reload: Accept external workload
tests/Makefile.sources | 1 +
tests/core_hot_reload.c | 305 ++++++++++++++++++++++++++++++++++++++++
tests/meson.build | 1 +
3 files changed, 307 insertions(+)
create mode 100644 tests/core_hot_reload.c
Last time (submission marked as v5) I tried to restore original
version numbering since initial internal submission and I failed,
sorry. There was one more public submission I missed, that's why
we now have v7, not v6, sorry.
I've also rearranged v5->v6 description to better reflect ideas
standing behind, and credited authors of comments, requests and
suggestions I followed.
Changelog:
v6->v7:
- add missing igt_exit() needed with the second patch.
v5->v6 (third public submission, incorrectly marked as v5, sorry):
- run workload inside an igt helper subprocess so resources consumed
by the workload are cleaned up automatically on workload subprocess
crash, without affecting test results,
- move the igt helper with workload back from subtests to initial
fixture so workload crash also does not affect test results,
- re-add the second patch which extends the test with an option for
using an external command as a workload,
- other cleanups suggested by Kasia and Chris.
v4->v5 (second public submission, marked as v2):
- try to restore the device to a working state after each subtest
(Peter, Daniel).
v3->v4 (first public submission, not marked with any version number):
- run dummy_workolad from inside subtests (Antonio).
v2->v3 (internal submission):
- run dummy_workload from the test process directly (Antonio),
- drop the patch for running external workload (Antonio).
v1->v2 (internal submission):
- run a subprocess with dummy_workload instead of external command
(Antonio),
- keep use of external workload command as an option, move that to a
separate patch.
--
2.20.1
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next reply other threads:[~2019-04-10 10:02 UTC|newest]
Thread overview: 13+ messages / expand[flat|nested] mbox.gz Atom feed top
2019-04-10 10:02 Janusz Krzysztofik [this message]
2019-04-10 10:02 ` [igt-dev] [PATCH v6 1/2] tests: Add a new test for driver/device hot reload Janusz Krzysztofik
2019-04-10 10:02 ` [igt-dev] [PATCH v6 2/2] tests/core_hot_reload: Accept external workload Janusz Krzysztofik
2019-04-10 10:05 ` [igt-dev] [PATCH v7 0/2] Add a new test for driver/device hot reload Janusz Krzysztofik
2019-04-10 10:34 ` [igt-dev] ✓ Fi.CI.BAT: success for Add a new test for driver/device hot reload (rev2) Patchwork
2019-04-10 14:11 ` [igt-dev] ✗ Fi.CI.IGT: failure " Patchwork
2019-04-11 12:26 ` [igt-dev] [RESUBMIT][PATCH v7 0/2] Add a new test for driver/device hot reload Janusz Krzysztofik
2019-04-11 12:26 ` [igt-dev] [PATCH v7 1/2] tests: " Janusz Krzysztofik
2019-04-12 8:16 ` Katarzyna Dec
2019-04-16 7:17 ` Janusz Krzysztofik
2019-04-17 8:53 ` Katarzyna Dec
2019-04-17 10:37 ` Janusz Krzysztofik
2019-04-11 12:26 ` [igt-dev] [PATCH v7 2/2] tests/core_hot_reload: Accept external workload Janusz Krzysztofik
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