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From: Janusz Krzysztofik <janusz.krzysztofik@linux.intel.com>
To: Arkadiusz Hiler <arkadiusz.hiler@intel.com>,
	Petri Latvala <petri.latvala@intel.com>
Cc: igt-dev@lists.freedesktop.org, Daniel Vetter <daniel@ffwll.ch>
Subject: [igt-dev] [PATCH v7 0/2] Add a new test for driver/device hot reload
Date: Wed, 10 Apr 2019 12:02:24 +0200	[thread overview]
Message-ID: <20190410100226.20618-1-janusz.krzysztofik@linux.intel.com> (raw)

The test should help resolving driver bugs which exhibit themselves
when a device is unplugged / driver unbind from a device while the
device is busy (different from simple module unload which requires 
device references being put first).

Janusz Krzysztofik (2):
  tests: Add a new test for driver/device hot reload
  tests/core_hot_reload: Accept external workload

 tests/Makefile.sources  |   1 +
 tests/core_hot_reload.c | 305 ++++++++++++++++++++++++++++++++++++++++
 tests/meson.build       |   1 +
 3 files changed, 307 insertions(+)
 create mode 100644 tests/core_hot_reload.c


Last time (submission marked as v5) I tried to restore original
version numbering since initial internal submission and I failed,
sorry.  There was one more public submission I missed, that's why
we now have v7, not v6, sorry.

I've also rearranged v5->v6 description to better reflect ideas
standing behind, and credited authors of comments, requests and
suggestions I followed.
 

Changelog:
v6->v7:
- add missing igt_exit() needed with the second patch.

v5->v6 (third public submission, incorrectly marked as v5, sorry):
- run workload inside an igt helper subprocess so resources consumed
  by the workload are cleaned up automatically on workload subprocess
  crash, without affecting test results,
- move the igt helper with workload back from subtests to initial
  fixture so workload crash also does not affect test results,
- re-add the second patch which extends the test with an option for
  using an external command as a workload,
- other cleanups suggested by Kasia and Chris.

v4->v5 (second public submission, marked as v2):
- try to restore the device to a working state after each subtest
  (Peter, Daniel).

v3->v4 (first public submission, not marked with any version number):
- run dummy_workolad from inside subtests (Antonio).

v2->v3 (internal submission):
- run dummy_workload from the test process directly (Antonio),
- drop the patch for running external workload (Antonio).

v1->v2 (internal submission):
- run a subprocess with dummy_workload instead of external command
  (Antonio),
- keep use of external workload command as an option, move that to a
  separate patch.

-- 
2.20.1

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             reply	other threads:[~2019-04-10 10:02 UTC|newest]

Thread overview: 13+ messages / expand[flat|nested]  mbox.gz  Atom feed  top
2019-04-10 10:02 Janusz Krzysztofik [this message]
2019-04-10 10:02 ` [igt-dev] [PATCH v6 1/2] tests: Add a new test for driver/device hot reload Janusz Krzysztofik
2019-04-10 10:02 ` [igt-dev] [PATCH v6 2/2] tests/core_hot_reload: Accept external workload Janusz Krzysztofik
2019-04-10 10:05 ` [igt-dev] [PATCH v7 0/2] Add a new test for driver/device hot reload Janusz Krzysztofik
2019-04-10 10:34 ` [igt-dev] ✓ Fi.CI.BAT: success for Add a new test for driver/device hot reload (rev2) Patchwork
2019-04-10 14:11 ` [igt-dev] ✗ Fi.CI.IGT: failure " Patchwork
2019-04-11 12:26 ` [igt-dev] [RESUBMIT][PATCH v7 0/2] Add a new test for driver/device hot reload Janusz Krzysztofik
2019-04-11 12:26   ` [igt-dev] [PATCH v7 1/2] tests: " Janusz Krzysztofik
2019-04-12  8:16     ` Katarzyna Dec
2019-04-16  7:17       ` Janusz Krzysztofik
2019-04-17  8:53         ` Katarzyna Dec
2019-04-17 10:37           ` Janusz Krzysztofik
2019-04-11 12:26   ` [igt-dev] [PATCH v7 2/2] tests/core_hot_reload: Accept external workload Janusz Krzysztofik

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