[igt-dev] [i-g-t 73/79] tests/kms_sysfs_edid_timing: Document each subtest for testplan

[Bhanuprakash Modem <bhanuprakash.modem@intel.com>]

Add documentation for all kms tests which is used by IGT testplan
documentation.

Signed-off-by: Bhanuprakash Modem <bhanuprakash.modem@intel.com>
---
 tests/kms_sysfs_edid_timing.c | 21 +++++++++++++++++++++
 1 file changed, 21 insertions(+)

diff --git a/tests/kms_sysfs_edid_timing.c b/tests/kms_sysfs_edid_timing.c
index 775211089..e185eaf6d 100644
--- a/tests/kms_sysfs_edid_timing.c
+++ b/tests/kms_sysfs_edid_timing.c
@@ -25,6 +25,27 @@
 #include <dirent.h>
 #include <fcntl.h>
 #include <sys/stat.h>
+/**
+ * TEST: kms sysfs edid timing
+ * Category: Display
+ * Description: This test checks the time it takes to reprobe each connector and
+ *              fails if either the time it takes for one reprobe is too long or
+ *              if the mean time it takes to reprobe one connector is too long.
+ *              Additionally, make sure that the mean time for all connectors is
+ *              not too long.
+ *
+ * SUBTEST:
+ * Description: This test checks the time it takes to reprobe each connector and
+ *              fails if either the time it takes for one reprobe is too long or
+ *              if the mean time it takes to reprobe one connector is too long.
+ *              Additionally, make sure that the mean time for all connectors is
+ *              not too long.
+ * Driver requirement: any
+ * Functionality: kms_core
+ * Mega feature: General Display Features
+ * Run type: FULL
+ * Test category: functionality test
+ */
 
 #define THRESHOLD_PER_CONNECTOR		150
 #define THRESHOLD_PER_CONNECTOR_MEAN	140
-- 
2.40.0