From mboxrd@z Thu Jan 1 00:00:00 1970 From: grant.likely@secretlab.ca (Grant Likely) Date: Mon, 15 Apr 2013 14:30:38 +0100 Subject: [PATCH] clk: add DT test clock consumer driver In-Reply-To: <1363439376-21294-1-git-send-email-sebastian.hesselbarth@gmail.com> References: <1363439376-21294-1-git-send-email-sebastian.hesselbarth@gmail.com> Message-ID: <20130415133038.2A7723E0AA8@localhost> To: linux-arm-kernel@lists.infradead.org List-Id: linux-arm-kernel.lists.infradead.org On Sat, 16 Mar 2013 14:09:36 +0100, Sebastian Hesselbarth wrote: > This driver adds a DT test clock consumer that exposes debugfs files to > enable/disable and set/get rate of the attached programmable clock. > During development of a i2c-attached clock generator I found it useful > to debug the clock generator's internal pll settings by enforcing clock > rates through debugfs. > > Signed-off-by: Sebastian Hesselbarth Rather that using a DT binding to enable this, would it not be better to have the debug interface bound entirely at runtime, and be able to attach to pretty much any clock. It is less usable if it requires modifying the dtb to use a debug feature. g.