[PATCH v2 1/2] pwm: samsung: Fix a bit test in pwm_samsung_resume()

[PATCH v2 1/2] pwm: samsung: Fix a bit test in pwm_samsung_resume()

[Dan Carpenter]

The PWMF_REQUESTED enum is supposed to be used with test_bit() and not
used as in a bitwise AND.  In this specific code the flag will never be
set so the function is effectively a no-op.

Fixes: e3fe982b2e4e ("pwm: samsung: Put per-channel data into driver data")
Signed-off-by: Dan Carpenter <dan.carpenter@linaro.org>
---
v2: Split the patch into two parts

 drivers/pwm/pwm-samsung.c | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/drivers/pwm/pwm-samsung.c b/drivers/pwm/pwm-samsung.c
index 568491ed6829..69d9f4577b34 100644
--- a/drivers/pwm/pwm-samsung.c
+++ b/drivers/pwm/pwm-samsung.c
@@ -631,7 +631,7 @@ static int pwm_samsung_resume(struct device *dev)
 		struct pwm_device *pwm = &chip->pwms[i];
 		struct samsung_pwm_channel *chan = &our_chip->channel[i];
 
-		if (!(pwm->flags & PWMF_REQUESTED))
+		if (!test_bit(PWMF_REQUESTED, &pwm->flags))
 			continue;
 
 		if (our_chip->variant.output_mask & BIT(i))
-- 
2.42.0


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Re: [PATCH v2 1/2] pwm: samsung: Fix a bit test in pwm_samsung_resume()

[Uwe Kleine-König]

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Hello Dan,

On Wed, Oct 25, 2023 at 02:57:34PM +0300, Dan Carpenter wrote:
> The PWMF_REQUESTED enum is supposed to be used with test_bit() and not
> used as in a bitwise AND.  In this specific code the flag will never be
> set so the function is effectively a no-op.
> 
> Fixes: e3fe982b2e4e ("pwm: samsung: Put per-channel data into driver data")
> Signed-off-by: Dan Carpenter <dan.carpenter@linaro.org>

Reviewed-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de>

@Thierry: e3fe982b2e4e is currently in your for-next branch. So it would
be good to get Dan's patch into your PR for 6.7-rc1.

Thanks
Uwe

-- 
Pengutronix e.K.                           | Uwe Kleine-König            |
Industrial Linux Solutions                 | https://www.pengutronix.de/ |

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Re: [PATCH v2 1/2] pwm: samsung: Fix a bit test in pwm_samsung_resume()

[Uwe Kleine-König]

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Hello Thierry,

On Wed, Oct 25, 2023 at 02:11:03PM +0200, Uwe Kleine-König wrote:
> On Wed, Oct 25, 2023 at 02:57:34PM +0300, Dan Carpenter wrote:
> > The PWMF_REQUESTED enum is supposed to be used with test_bit() and not
> > used as in a bitwise AND.  In this specific code the flag will never be
> > set so the function is effectively a no-op.
> > 
> > Fixes: e3fe982b2e4e ("pwm: samsung: Put per-channel data into driver data")
> > Signed-off-by: Dan Carpenter <dan.carpenter@linaro.org>
> 
> Reviewed-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de>
> 
> @Thierry: e3fe982b2e4e is currently in your for-next branch. So it would
> be good to get Dan's patch into your PR for 6.7-rc1.

I saw you updated your for-next branch but didn't add this patch yet.
Would be great to get this one in to not get a known-broken state into
6.7-rc1.

Best regards
Uwe

-- 
Pengutronix e.K.                           | Uwe Kleine-König            |
Industrial Linux Solutions                 | https://www.pengutronix.de/ |

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Re: [PATCH v2 1/2] pwm: samsung: Fix a bit test in pwm_samsung_resume()

[Thierry Reding]

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On Mon, Nov 06, 2023 at 11:43:04AM +0100, Uwe Kleine-König wrote:
> Hello Thierry,
> 
> On Wed, Oct 25, 2023 at 02:11:03PM +0200, Uwe Kleine-König wrote:
> > On Wed, Oct 25, 2023 at 02:57:34PM +0300, Dan Carpenter wrote:
> > > The PWMF_REQUESTED enum is supposed to be used with test_bit() and not
> > > used as in a bitwise AND.  In this specific code the flag will never be
> > > set so the function is effectively a no-op.
> > > 
> > > Fixes: e3fe982b2e4e ("pwm: samsung: Put per-channel data into driver data")
> > > Signed-off-by: Dan Carpenter <dan.carpenter@linaro.org>
> > 
> > Reviewed-by: Uwe Kleine-König <u.kleine-koenig@pengutronix.de>
> > 
> > @Thierry: e3fe982b2e4e is currently in your for-next branch. So it would
> > be good to get Dan's patch into your PR for 6.7-rc1.
> 
> I saw you updated your for-next branch but didn't add this patch yet.
> Would be great to get this one in to not get a known-broken state into
> 6.7-rc1.

Yeah, I missed this when I was skimming the list for last-minute things
to include. I've applied these now and will send a follow-up PR.

Thierry

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Re: [PATCH v2 1/2] pwm: samsung: Fix a bit test in pwm_samsung_resume()

[Thierry Reding]

On Wed, 25 Oct 2023 14:57:34 +0300, Dan Carpenter wrote:
> The PWMF_REQUESTED enum is supposed to be used with test_bit() and not
> used as in a bitwise AND.  In this specific code the flag will never be
> set so the function is effectively a no-op.
> 
> 

Applied, thanks!

[1/2] pwm: samsung: Fix a bit test in pwm_samsung_resume()
      commit: 7d3c568084f8be53f7f59802d625fa69bc7f8d07
[2/2] pwm: Fix double shift bug
      commit: 830743dcf301141b4723ae38cf7d7fca566b9c75

Best regards,
-- 
Thierry Reding <thierry.reding@gmail.com>

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