From: Kanchan Joshi <joshi.k@samsung.com>
To: Luis Chamberlain <mcgrof@kernel.org>
Cc: bvanassche@acm.org, osandov@fb.com, j.granados@samsung.com,
anuj20.g@samsung.com, ankit.kumar@samsung.com,
vincent.fu@samsung.com, ming.lei@redhat.com,
linux-block@vger.kernel.org
Subject: Re: [PATCH 2/6] tests/nvme: add new test for rand-read on the nvme character device
Date: Tue, 17 Jan 2023 13:16:00 +0530 [thread overview]
Message-ID: <20230117074600.GA30000@green5> (raw)
In-Reply-To: <Y6XPs3MoyltFvEYT@bombadil.infradead.org>
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On Fri, Dec 23, 2022 at 07:56:35AM -0800, Luis Chamberlain wrote:
>On Fri, Dec 23, 2022 at 06:41:37PM +0530, Kanchan Joshi wrote:
>> On Wed, Dec 21, 2022 at 02:34:37AM -0800, Luis Chamberlain wrote:
>> > This does basic rand-read testing of the character device of a
>> > conventional NVMe drive.
>> >
>> > Signed-off-by: Luis Chamberlain <mcgrof@kernel.org>
>> > ---
>> > tests/nvme/046 | 42 ++++++++++++++++++++++++++++++++++++++++++
>> > tests/nvme/046.out | 2 ++
>> > 2 files changed, 44 insertions(+)
>> > create mode 100755 tests/nvme/046
>> > create mode 100644 tests/nvme/046.out
>> >
>> > diff --git a/tests/nvme/046 b/tests/nvme/046
>> > new file mode 100755
>> > index 000000000000..3526ab9eedab
>> > --- /dev/null
>> > +++ b/tests/nvme/046
>> > @@ -0,0 +1,42 @@
>> > +#!/bin/bash
>> > +# SPDX-License-Identifier: GPL-3.0+
>> > +# Copyright (C) 2022 Luis Chamberlain <mcgrof@kernel.org>
>> > +#
>> > +# This does basic sanity test for the nvme character device. This is a basic
>> > +# test and if it fails it is probably very likely other nvme character device
>> > +# tests would fail.
>> > +#
>> > +. tests/nvme/rc
>> > +
>> > +DESCRIPTION="basic rand-read io_uring_cmd engine for nvme-ns character device"
>> > +QUICK=1
>> > +
>> > +requires() {
>> > + _nvme_requires
>> > + _have_fio
>> > +}
>> > +
>> > +device_requires() {
>> > + _require_test_dev_is_nvme
>> > +}
>> > +
>> > +test_device() {
>> > + echo "Running ${TEST_NAME}"
>> > + local ngdev=${TEST_DEV/nvme/ng}
>> > + local fio_args=(
>> > + --size=1M
>> > + --cmd_type=nvme
>> > + --filename="$ngdev"
>> > + --time_based
>> > + --runtime=10
>> > + ) &&
>>
>> Is this && needed?
>
>This form was inspired by commit 238c7e0b by Bart, but yeah you're
>right, I can't see any reason for it, so we can clean zbd/010 from it too.
>>
>> > + _run_fio_rand_iouring_cmd "${fio_args[@]}" >>"${FULL}" 2>&1 ||
>>
>> Something to change here (and therefore in other patches too).
>> If we change "cmd_type = something_random", test continues to show the
>> success while it should show failure.
>
>Definitely no bueno.
>
>> How about changing above line to:
>> _run_fio_rand_iouring_cmd "${fio_args[@]}" || fail=true
>
>We'd loose the 046.full log then.
>
>If we just return $? at the end of _run_fio_rand_iouring_cmd() that
>seems to fix the undetected error. Whatyda think?
It did not fix for me. It still shows test passed for "cmd_type=random".
How about this one instead-
_run_fio_rand_iouring_cmd "${fio_args[@]}" >>"${FULL}" || fail=true
it retains the full log, and shows the error when it occurs.
>I noticed an odd thing in the last two patches which work for zone
>storage, if I change the runtime it doesn't take longer, so I think
>something is still off there too... can you take a look?
Runtime change works fine for first zoned test (i.e. read one).
For the last one (i.e. zbd/012), fio fails early (that's why runtime
does not have any impact) because rw is set to randread along with
verify. It should rather be set to write.
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next prev parent reply other threads:[~2023-01-17 7:46 UTC|newest]
Thread overview: 14+ messages / expand[flat|nested] mbox.gz Atom feed top
2022-12-21 10:34 [PATCH 0/6] blktests: char device tests with iouring-cmd fio Luis Chamberlain
2022-12-21 10:34 ` [PATCH 1/6] common/fio: add helpers using io-uring cmd engine Luis Chamberlain
2022-12-30 10:10 ` Joel Granados
2022-12-21 10:34 ` [PATCH 2/6] tests/nvme: add new test for rand-read on the nvme character device Luis Chamberlain
2022-12-23 13:11 ` Kanchan Joshi
2022-12-23 15:56 ` Luis Chamberlain
2023-01-17 7:46 ` Kanchan Joshi [this message]
2022-12-30 10:37 ` Joel Granados
2023-01-03 5:48 ` Chaitanya Kulkarni
2022-12-21 10:34 ` [PATCH 3/6] tests/nvme: add new test for rand-write " Luis Chamberlain
2022-12-21 10:34 ` [PATCH 4/6] tests/nvme: add new test for optimal write " Luis Chamberlain
2022-12-21 10:34 ` [PATCH 5/6] tests/zbd: add new basic test for reading zone " Luis Chamberlain
2022-12-21 10:34 ` [PATCH 6/6] " Luis Chamberlain
2022-12-28 3:25 ` [PATCH 0/6] blktests: char device tests with iouring-cmd fio Shinichiro Kawasaki
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