Re: [PATCH v3 2/4] hwmon: Document the samples attributes

[Guenter Roeck <linux@roeck-us.net>]

On Sun, Apr 14, 2019 at 09:58:40PM +0000, Adamski, Krzysztof (Nokia - PL/Wroclaw) wrote:
> Document new ABI attributes: {in,power,curr,temp}_samples and samples.
> 
> Signed-off-by: Krzysztof Adamski <krzysztof.adamski@nokia.com>

Applied to hwmon-next.

Thanks,
Guenter

> ---
>  Documentation/hwmon/sysfs-interface | 18 ++++++++++++++++++
>  1 file changed, 18 insertions(+)
> 
> diff --git a/Documentation/hwmon/sysfs-interface b/Documentation/hwmon/sysfs-interface
> index 2b9e1005d88b..7b91706d01c8 100644
> --- a/Documentation/hwmon/sysfs-interface
> +++ b/Documentation/hwmon/sysfs-interface
> @@ -756,6 +756,24 @@ intrusion[0-*]_beep
>  		1: enable
>  		RW
>  
> +********************************
> +* Average sample configuration *
> +********************************
> +
> +Devices allowing for reading {in,power,curr,temp}_average values may export
> +attributes for controlling number of samples used to compute average.
> +
> +samples		Sets number of average samples for all types of measurements.
> +		RW
> +
> +in_samples
> +power_samples
> +curr_samples
> +temp_samples    Sets number of average samples for specific type of measurements.
> +		Note that on some devices it won't be possible to set all of them
> +		to different values so changing one might also change some others.
> +		RW
> +
>  
>  sysfs attribute writes interpretation
>  -------------------------------------