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From: "Lars Michael Jogbäck" <lm@jogback.se>
To: Tejun Heo <htejun@gmail.com>
Cc: linux-ide@vger.kernel.org
Subject: Re: Problems w/ Sil3124 + Port Multiplier
Date: Wed, 02 May 2007 15:30:54 +0200	[thread overview]
Message-ID: <4638928E.60700@jogback.se> (raw)
In-Reply-To: <46388862.1020709@gmail.com>

Tejun Heo wrote:
> Lars Michael Jogbäck wrote:
>   
>> I have a system with a Sil3124 controller and two Sil3726 port multipliers.
>> I'm running 2.6.18.1 with the patches from
>> http://home-tj.org/wiki/index.php/Libata-tj-stable
>> since I was not able to get the port multipler to work at all with
>> 2.6.21 (perhaps the support for PMP is not fully integrated there).
>>
>> One of my Sil3726 is freezing my system approx one time per hour when
>> the disks are under load.
>>
>> ata5.00: exception Emask 0x0 SAct 0x0 SErr 0x0 action 0x2 frozen
>> ata5.00: tag 0 cmd 0xea Emask 0x4 stat 0x40 err 0x0 (timeout)
>>     
>
> Hmmm... that's FLUSH_CACHE timing out.
>   
Is there a way that I can generate a FLUSH_CACHE event manually somehow?
>   
>> I suspect that the root-cause of the problem could be drive-related. All
>> the disks on the other Sil3726 are WD4000KD's and the
>> disks attached to this one is 3xWD4000KD and 1xWD4000KS and 1xSamsung
>> HD501LJ. Is there a way of test this?
>>     
>
> I think the disk attached to port 0 might be bad.  Please report the
> result of 'smartctl -d ata -a /dev/sdX' where sdX is the device attached
> to the failing port.
>
>   
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG HD501LJ
Serial Number:    S0VVJ1NP300009
Firmware Version: CR100-10
User Capacity:    500,107,862,016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  Not recognized. Minor revision code: 0x52
Local Time is:    Wed May  2 15:26:35 2007 CEST

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for 
details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: 
Disabled.
Self-test execution status:      (   0) The previous self-test routine 
completed
                                        without error or no self-test 
has ever
                                        been run.
Total time to complete Offline
data collection:                 (8887) seconds.
Offline data collection
capabilities:                    (0x5b) SMART execute Offline immediate.
                                        Auto Offline data collection 
on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        ( 152) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      
UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  
Always       -       2
  3 Spin_Up_Time            0x0007   100   100   015    Pre-fail  
Always       -       7232
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   
Always       -       3
  5 Reallocated_Sector_Ct   0x0033   253   253   010    Pre-fail  
Always       -       0
  7 Seek_Error_Rate         0x000f   253   253   051    Pre-fail  
Always       -       0
  8 Seek_Time_Performance   0x0025   253   253   015    Pre-fail  
Offline      -       0
  9 Power_On_Hours          0x0032   253   253   000    Old_age   
Always       -       49
 10 Spin_Retry_Count        0x0033   253   253   051    Pre-fail  
Always       -       0
 11 Calibration_Retry_Count 0x0012   253   253   000    Old_age   
Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   
Always       -       3
187 Unknown_Attribute       0x0032   253   253   000    Old_age   
Always       -       0
188 Unknown_Attribute       0x0032   253   253   000    Old_age   
Always       -       0
190 Unknown_Attribute       0x0022   070   069   000    Old_age   
Always       -       30
194 Temperature_Celsius     0x0022   148   145   000    Old_age   
Always       -       30
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   
Always       -       385707184
196 Reallocated_Event_Count 0x0032   253   253   000    Old_age   
Always       -       0
197 Current_Pending_Sector  0x0012   253   253   000    Old_age   
Always       -       0
198 Offline_Uncorrectable   0x0030   253   253   000    Old_age   
Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   
Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   
Always       -       0
201 Soft_Read_Error_Rate    0x000a   100   100   000    Old_age   
Always       -       0
202 TA_Increase_Count       0x0032   100   100   000    Old_age   
Always       -       21

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  
LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%        
49         -

SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data 
structure revision number = 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.


>> Is there an updated patch-set for port multipliers in a later kernel
>> than 2.6.18.1?
>>     
>
> Sorry but not yet.
>
>   
Regards,
/LM



  reply	other threads:[~2007-05-02 13:30 UTC|newest]

Thread overview: 7+ messages / expand[flat|nested]  mbox.gz  Atom feed  top
2007-05-02  6:00 Problems w/ Sil3124 + Port Multiplier Lars Michael Jogbäck
2007-05-02 12:47 ` Tejun Heo
2007-05-02 13:30   ` Lars Michael Jogbäck [this message]
2007-05-02 13:34     ` Mark Lord
2007-05-03  9:08     ` Tejun Heo
2007-05-03 11:04       ` Lars Michael Jogbäck
2007-05-03 11:37         ` Tejun Heo

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