From: Damazy <damazy@gmail.com>
To: Tejun Heo <tj@kernel.org>
Cc: jgarzik@pobox.com, linux-ide@vger.kernel.org
Subject: Re: sata_sil for 3512A chip on kernel 2.6.26.3
Date: Wed, 15 Oct 2008 08:37:50 +0200 [thread overview]
Message-ID: <48F58FBE.909@gmail.com> (raw)
In-Reply-To: <48F54E4C.1020704@kernel.org>
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Tejun Heo wrote:
>
> The commands are either being timed out or aborted by the device. Can
> you post the result of "smartctl -a" of the drive?
>
This is output of smartctl -a /dev/sda1
smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD502IJ
Serial Number: S13TJ90Q641644
Firmware Version: 1AA01112
User Capacity: 500,106,780,160 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 3b
Local Time is: Wed Oct 15 08:32:29 2008 CEST
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for
details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection:
Disabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test
has ever
been run.
Total time to complete Offline
data collection: (7461) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection
on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 125) minutes.
Conveyance self-test routine
recommended polling time: ( 14) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail
Always - 0
3 Spin_Up_Time 0x0007 087 087 011 Pre-fail
Always - 4870
4 Start_Stop_Count 0x0032 100 100 000 Old_age
Always - 47
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail
Always - 0
8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail
Offline - 9770
9 Power_On_Hours 0x0032 100 100 000 Old_age
Always - 1178
10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail
Always - 0
11 Calibration_Retry_Count 0x0012 100 100 000 Old_age
Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age
Always - 46
13 Read_Soft_Error_Rate 0x000e 100 100 000 Old_age
Always - 0
183 Unknown_Attribute 0x0032 100 100 000 Old_age Always
- 0
184 Unknown_Attribute 0x0033 100 100 099 Pre-fail Always
- 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always
- 0
188 Unknown_Attribute 0x0032 100 100 000 Old_age Always
- 0
190 Airflow_Temperature_Cel 0x0022 063 060 000 Old_age Always
- 37 (Lifetime Min/Max 35/40)
194 Temperature_Celsius 0x0022 063 059 000 Old_age Always
- 37 (Lifetime Min/Max 35/41)
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always
- 115423
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always
- 0
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x003e 099 099 000 Old_age Always
- 311
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always
- 0
201 Soft_Read_Error_Rate 0x000a 253 253 000 Old_age Always
- 0
SMART Error Log Version: 1
ATA Error Count: 190 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 190 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 3f 00 ee 1d e0 Error: ICRC, ABRT 63 sectors at LBA =
0x001dee00 = 1961472
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 3f ed 1d e0 00 00:50:52.250 READ DMA
c8 00 00 3f ec 1d e0 00 00:50:52.250 READ DMA
c8 00 00 3f eb 1d e0 00 00:50:52.250 READ DMA
c8 00 00 3f ea 1d e0 00 00:50:52.250 READ DMA
c8 00 00 3f e9 1d e0 00 00:50:52.250 READ DMA
Error 189 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 9f 58 db 1c e0 Error: ICRC, ABRT 159 sectors at LBA =
0x001cdb58 = 1891160
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 f7 da 1c e0 00 00:50:45.810 READ DMA
c8 00 00 f7 d9 1c e0 00 00:50:45.810 READ DMA
c8 00 00 f7 d8 1c e0 00 00:50:45.810 READ DMA
c8 00 00 f7 d7 1c e0 00 00:50:45.810 READ DMA
c8 00 00 f7 d6 1c e0 00 00:50:45.800 READ DMA
Error 188 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
00 d0 00 00 00 00 a0 at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 3f c5 1a e0 00 00:50:38.500 READ DMA
c8 00 00 3f c4 1a e0 00 00:50:38.490 READ DMA
ca 00 08 df d1 e9 ea 00 00:50:38.480 WRITE DMA
ca 00 08 d7 b1 e9 ea 00 00:50:38.480 WRITE DMA
ca 00 08 cf 91 e9 ea 00 00:50:38.480 WRITE DMA
Error 187 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 4f d0 35 1a e0 Error: ICRC, ABRT 79 sectors at LBA =
0x001a35d0 = 1717712
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 1f 35 1a e0 00 00:50:32.800 READ DMA
c8 00 80 9f 34 1a e0 00 00:50:32.790 READ DMA
c8 00 88 17 34 1a e0 00 00:50:32.790 READ DMA
c8 00 00 17 33 1a e0 00 00:50:32.790 READ DMA
c8 00 00 17 32 1a e0 00 00:50:32.790 READ DMA
Error 186 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 1f d0 66 16 e0 Error: ICRC, ABRT 31 sectors at LBA =
0x001666d0 = 1468112
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 ef 65 16 e0 00 00:50:28.720 READ DMA
c8 00 00 ef 64 16 e0 00 00:50:28.720 READ DMA
c8 00 00 ef 63 16 e0 00 00:50:28.720 READ DMA
c8 00 80 6f 63 16 e0 00 00:50:28.720 READ DMA
c8 00 88 e7 62 16 e0 00 00:50:28.710 READ DMA
SMART Self-test log structure revision number 0
Warning: ATA Specification requires self-test log structure revision
number = 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 529
-
# 2 Short offline Aborted by host 00% 458
-
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data
structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Kind regards.
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next prev parent reply other threads:[~2008-10-15 6:37 UTC|newest]
Thread overview: 10+ messages / expand[flat|nested] mbox.gz Atom feed top
2008-10-02 8:53 sata_sil for 3512A chip on kernel 2.6.26.3 Damazy
2008-10-04 7:39 ` Tejun Heo
2008-10-14 10:49 ` Damazy
2008-10-15 1:58 ` Tejun Heo
2008-10-15 6:37 ` Damazy [this message]
2008-10-15 6:46 ` Tejun Heo
2008-10-15 7:03 ` Damazy
2008-10-15 7:06 ` Tejun Heo
2008-10-15 7:19 ` Damazy
2008-10-15 7:25 ` Tejun Heo
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