[PATCH] selftests/input: introduce a test for the EVIOCGLED ioctl

[Dana Elfassy <delfassy@redhat.com>]

This patch introduces a specific test case for the EVIOCGLED ioctl.
The test covers the case where len > maxlen in the
EVIOCGLED(sizeof(all_leds)), all_leds) ioctl.

Signed-off-by: Dana Elfassy <dangel101@gmail.com>
---
This patch depends on '[v3] selftests/input: Introduce basic tests for evdev ioctls' [1] sent to the ML.
[1] https://patchwork.kernel.org/project/linux-input/patch/20230607153214.15933-1-eballetbo@kernel.org/

 tools/testing/selftests/input/evioc-test.c | 17 +++++++++++++++++
 1 file changed, 17 insertions(+)

diff --git a/tools/testing/selftests/input/evioc-test.c b/tools/testing/selftests/input/evioc-test.c
index ad7b93fe39cf..2bf1b32ae01a 100644
--- a/tools/testing/selftests/input/evioc-test.c
+++ b/tools/testing/selftests/input/evioc-test.c
@@ -234,4 +234,21 @@ TEST(eviocsrep_set_repeat_settings)
 	selftest_uinput_destroy(uidev);
 }
 
+TEST(eviocgled_get_all_leds)
+{
+	struct selftest_uinput *uidev;
+	int leds[2];
+	int rc;
+
+	rc = selftest_uinput_create_device(&uidev, -1);
+	ASSERT_EQ(0, rc);
+	ASSERT_NE(NULL, uidev);
+
+	/* ioctl to set the maxlen = 0 */
+	rc = ioctl(uidev->evdev_fd, EVIOCGLED(0), leds);
+	ASSERT_EQ(0, rc);
+
+	selftest_uinput_destroy(uidev);
+}
+
 TEST_HARNESS_MAIN
-- 
2.41.0