Re: [PATCH 33/57] media: atomisp: ov2680: Add test pattern control

Andy Shevchenko
2023-01-24T12:53:15Z

On Tue, Jan 24, 2023 at 12:27:55PM +0100, Hans de Goede wrote:
> On 1/23/23 19:46, Andy Shevchenko wrote:
> > On Mon, Jan 23, 2023 at 01:51:41PM +0100, Hans de Goede wrote:
> >> Add a test pattern control. This is a 1:1 copy of the test pattern
> >> control in the main drivers/media/i2c/ov2680.c driver.
> >
> > Hmm... I'm not sure I understand the trend of the changes.
> > We have two drivers of the same sensor, correct?
> > So, the idea is to move the AtomISP-specific one to be like
> > the generic and then kill it eventually?
>
> The goal is to kill one eventually yes. I'm not sure which
> one to kill yet though. I have actually found a whole bunch
> of bugs in the main drivers/media/i2c/ov2680.c code and
> given its buggy-ness I wonder if anyone is actually using it.
>
> I need to start an email thread about this (and a couple of
> other open questions which I have), I have a bunch of notes
> which I need to turn into emails for this.
>
> > If so, why do we add something here?
>
> Because I suspect that the atomisp version might eventually
> be the one we want to keep (and move to drivers/media/i2c).

Fine, just add a few words into cover letter.

Btw, do you use `b4` tool to handle patch(es) series?
It has a nice feature to handle a series as a PR. In
that case the cover letter becomes a merge-commit message
which is cool feature in my opinion.

--
With Best Regards,
Andy Shevchenko