On Thu, Jun 23, 2011 at 10:12 AM, Luck, Tony
<tony.luck@intel.com> wrote:
> I don't think it makes sense to handle something like that with a list.
> The compact representation currently in badram is great for that.
I'd tend to agree here. Rick has made a convincing argument that there
are significant numbers of real world cases where a defective row/column
in a DIMM results in a predictable pattern of errors. The ball is now
in Google's court to take a look at their systems that have high numbers
of errors to see if they can actually be described by a small number
of BadRAM patterns as Rick has claimed.
Hi All,
We (Google) are working on a data-driven answer for this question. I know that there has been some analysis on this topic on the past, but I don't want to speculate until we've had some time to put all the pieces together. Stay tuned for specifics.
Cheers,
CraigB
-Tony