From mboxrd@z Thu Jan 1 00:00:00 1970 Received: from antispam01.maxim-ic.com ([205.153.101.182]) by bombadil.infradead.org with esmtp (Exim 4.69 #1 (Red Hat Linux)) id 1MnTOX-0002Dy-BD for linux-mtd@lists.infradead.org; Tue, 15 Sep 2009 08:28:17 +0000 Message-ID: <4AAF5016.2030809@maxim-ic.com> Date: Tue, 15 Sep 2009 13:58:06 +0530 From: JerinJacob MIME-Version: 1.0 To: "dedekind1@gmail.com" Subject: Re: UBIFS Error References: <4AA5F37F.4050307@maxim-ic.com> <4AA60E6C.6060307@nokia.com> <4AA8EA9C.4070805@maxim-ic.com> <4AA8ED7B.5020509@nokia.com> <4AA8F6E4.1090209@maxim-ic.com> <4AA90351.3050000@nokia.com> <4AAA4005.9080707@maxim-ic.com> <1252938440.5060.102.camel@localhost> <1252938588.5060.103.camel@localhost> In-Reply-To: <1252938588.5060.103.camel@localhost> Content-Type: text/plain; charset="UTF-8"; format=flowed Content-Transfer-Encoding: 7bit Cc: "Artem.Bityutskiy@nokia.com" , "linux-mtd@lists.infradead.org" , "Hunter Adrian \(Nokia-D/Helsinki\)" List-Id: Linux MTD discussion mailing list List-Unsubscribe: , List-Archive: List-Post: List-Help: List-Subscribe: , I've created this piece of documentation for you: http://www.linux-mtd.infradead.org/doc/general.html#L_mtd_tests Please, validate your flash driver/HW. >> Got a crash while reading a large mtd device with "mtd_readtest". Let me fix this platform specific driver bug. Any way this mtd_tests are very use full. And here is the text in case someone would review it: >> you may add how to run the test. >> modprobe mtd_readtest dev=6 ; rmmod mtd_readtest Artem Bityutskiy wrote: > On Mon, 2009-09-14 at 17:27 +0300, Artem Bityutskiy wrote: > >>>> And finally, could you please try to reproduce this problem with >>>> nandsim: >>>> http://www.linux-mtd.infradead.org/faq/nand.html#L_nand_nandsim >>>> >>>> >>> >>> Unfortunately, I couldn't reproduce the problem with nandsim.It >>> works with nansim. >>> However i couldn't test with 1GiB nandsim as it needs 1GiB ram.Tested >>> with 512MiB nandsim. >>> >>> I guess it is a could be data corruption either in platform specific >>> driver or ubifs. >>> Is there any way we can validate the platform specific nand driver ? >>> Please let me know your views on this? >>> >>> Actually we are in the process of migrating from yaffs to ubifs, The >>> same test application works with >>> yaffs as well. >>> >> I've created this piece of documentation for you: >> http://www.linux-mtd.infradead.org/doc/general.html#L_mtd_tests >> >> Please, validate your flash driver/HW. >> > > And here is the text in case someone would review it: > > The MTD subsystem includes a set of tests which you may run to verify > your flash hardware and drivers. The tests are available in the mainline > kernels starting from kernel version 2.6.29 and they live in the > drivers/mtd/tests directory of the linux kernel source codes. You may > compile the tests as kernel modules by enabling them in the kernel > configuration menu by marking: "Device Drivers" -> "Memory Technology > Devices (MTD)" -> "MTD tests support" (or the MTD_TESTS symbol in > the .config file). > > If you have a pre-2.6.29 kernel, you may find the tests here: > > git://git.infradead.org/users/ahunter/nand-tests.git > > The MTD test-suite contains the following tests: > > * mtd_speedtest: measures and reports read/write/erase speed of > the MTD device. > * mtd_stresstest: performs random read/write/erase operations and > validates the MTD device I/O capabilities. > * mtd_readtest: this tests reads whole MTD device, one NAND page > at a time including OOB (or 512 bytes at a time in case of > flashes like NOR) and checks that reading works properly. > * mtd_pagetest: relevant only for NAND flashes, tests NAND page > writing and reading in different sizes and order; this test was > originally developed for testing the OneNAND driver, so it might > be a little OneNAND-oriented, but must work on any NAND flash. > * mtd_oobtest: relevant only for NAND flashes, tests that the OOB > area I/O works properly by writing data to different offsets and > verifying it. > * mtd_subpagetest: relevant only for NAND flashes, tests sub-page > I/O. > * mtd_torturetest: this test is designed to wear out flash > eraseblocks. It repeatedly writes and erases the same group of > eraseblocks until an I/O error happens, so be careful! The test > supports a number of options (see modinfo mtd_torturetest) which > allow you to set the amount of eraseblocks to torture and how > the torturing is done. You may limit the amount of torturing > cycles using the cycles_count module parameter. It may be very > god idea to run this test for some time and validate your flash > driver and HW, providing you have a spare device. For example, > we caught rather rare and nasty DMA issues on an OMAP2 board > with OneNAND flash, just by running this tests for few hours. > >