From mboxrd@z Thu Jan 1 00:00:00 1970 Received: from antispam01.maxim-ic.com ([205.153.101.182]) by bombadil.infradead.org with esmtp (Exim 4.69 #1 (Red Hat Linux)) id 1MoCVl-0007ST-0o for linux-mtd@lists.infradead.org; Thu, 17 Sep 2009 08:38:44 +0000 Message-ID: <4AB1F58D.7070809@maxim-ic.com> Date: Thu, 17 Sep 2009 14:08:37 +0530 From: JerinJacob MIME-Version: 1.0 To: "dedekind1@gmail.com" Subject: Re: UBIFS Error References: <4AA5F37F.4050307@maxim-ic.com> <4AA60E6C.6060307@nokia.com> <4AA8EA9C.4070805@maxim-ic.com> <4AA8ED7B.5020509@nokia.com> <4AA8F6E4.1090209@maxim-ic.com> <4AA90351.3050000@nokia.com> <4AAA4005.9080707@maxim-ic.com> <1252938440.5060.102.camel@localhost> <1252938588.5060.103.camel@localhost> <4AAF5016.2030809@maxim-ic.com> In-Reply-To: <4AAF5016.2030809@maxim-ic.com> Content-Type: text/plain; charset="UTF-8"; format=flowed Content-Transfer-Encoding: 7bit Cc: "Artem.Bityutskiy@nokia.com" , "linux-mtd@lists.infradead.org" , "Hunter Adrian \(Nokia-D/Helsinki\)" List-Id: Linux MTD discussion mailing list List-Unsubscribe: , List-Archive: List-Post: List-Help: List-Subscribe: , > >> Got a crash while reading a large mtd device with "mtd_readtest". Let me fix this platform specific driver bug. Any way this mtd_tests are very use full. >>> Fixed the platform specific driver bug.And all the mtd test case are passing now with zero errors. Unfortunately, Still the UBIFS crashing problem persist. JerinJacob wrote: > I've created this piece of documentation for you: > http://www.linux-mtd.infradead.org/doc/general.html#L_mtd_tests > > Please, validate your flash driver/HW. > >>> Got a crash while reading a large mtd device with "mtd_readtest". > Let me fix this platform specific driver bug. > Any way this mtd_tests are very use full. > > And here is the text in case someone would review it: > > >> you may add how to run the test. > >> modprobe mtd_readtest dev=6 ; rmmod mtd_readtest > > > Artem Bityutskiy wrote: >> On Mon, 2009-09-14 at 17:27 +0300, Artem Bityutskiy wrote: >> >>>>> And finally, could you please try to reproduce this problem with >>>>> nandsim: >>>>> http://www.linux-mtd.infradead.org/faq/nand.html#L_nand_nandsim >>>>> >>>> >>> Unfortunately, I couldn't reproduce the problem with >>>> nandsim.It works with nansim. >>>> However i couldn't test with 1GiB nandsim as it needs 1GiB >>>> ram.Tested with 512MiB nandsim. >>>> >>>> I guess it is a could be data corruption either in platform >>>> specific driver or ubifs. >>>> Is there any way we can validate the platform specific nand driver ? >>>> Please let me know your views on this? >>>> >>>> Actually we are in the process of migrating from yaffs to ubifs, >>>> The same test application works with >>>> yaffs as well. >>>> >>> I've created this piece of documentation for you: >>> http://www.linux-mtd.infradead.org/doc/general.html#L_mtd_tests >>> >>> Please, validate your flash driver/HW. >>> >> >> And here is the text in case someone would review it: >> >> The MTD subsystem includes a set of tests which you may run to verify >> your flash hardware and drivers. The tests are available in the mainline >> kernels starting from kernel version 2.6.29 and they live in the >> drivers/mtd/tests directory of the linux kernel source codes. You may >> compile the tests as kernel modules by enabling them in the kernel >> configuration menu by marking: "Device Drivers" -> "Memory Technology >> Devices (MTD)" -> "MTD tests support" (or the MTD_TESTS symbol in >> the .config file). >> >> If you have a pre-2.6.29 kernel, you may find the tests here: >> >> git://git.infradead.org/users/ahunter/nand-tests.git >> >> The MTD test-suite contains the following tests: >> >> * mtd_speedtest: measures and reports read/write/erase speed of >> the MTD device. >> * mtd_stresstest: performs random read/write/erase operations and >> validates the MTD device I/O capabilities. >> * mtd_readtest: this tests reads whole MTD device, one NAND page >> at a time including OOB (or 512 bytes at a time in case of >> flashes like NOR) and checks that reading works properly. >> * mtd_pagetest: relevant only for NAND flashes, tests NAND page >> writing and reading in different sizes and order; this test was >> originally developed for testing the OneNAND driver, so it might >> be a little OneNAND-oriented, but must work on any NAND flash. >> * mtd_oobtest: relevant only for NAND flashes, tests that the OOB >> area I/O works properly by writing data to different offsets and >> verifying it. >> * mtd_subpagetest: relevant only for NAND flashes, tests sub-page >> I/O. >> * mtd_torturetest: this test is designed to wear out flash >> eraseblocks. It repeatedly writes and erases the same group of >> eraseblocks until an I/O error happens, so be careful! The test >> supports a number of options (see modinfo mtd_torturetest) which >> allow you to set the amount of eraseblocks to torture and how >> the torturing is done. You may limit the amount of torturing >> cycles using the cycles_count module parameter. It may be very >> god idea to run this test for some time and validate your flash >> driver and HW, providing you have a spare device. For example, >> we caught rather rare and nasty DMA issues on an OMAP2 board >> with OneNAND flash, just by running this tests for few hours. >> >> >