From mboxrd@z Thu Jan 1 00:00:00 1970 Received: from mail.grid-net.com ([97.65.115.2]) by merlin.infradead.org with esmtps (Exim 4.76 #1 (Red Hat Linux)) id 1SRSJR-0001al-Ev for linux-mtd@lists.infradead.org; Mon, 07 May 2012 18:05:35 +0000 Message-ID: <4FA80EEB.8040501@grid-net.com> Date: Mon, 7 May 2012 11:05:31 -0700 From: Subodh Nijsure MIME-Version: 1.0 To: mtd Subject: What would cause large block of NAND to be marked as bad? Content-Type: text/plain; charset="ISO-8859-1"; format=flowed Content-Transfer-Encoding: 7bit List-Id: Linux MTD discussion mailing list List-Unsubscribe: , List-Archive: List-Post: List-Help: List-Subscribe: , Hello, I am working with some prototype hardware and I have seen some weird behaviour when testing power cut. On my board I have Micron MT29F2G08ABAEAH4 part and now have three boards on which close to 20-30 blocks have been marked as bad. We mainly run UBIFS on these boards, if there was flash data corruption we expected to see errors at UBIFS level i.e. not able to mount UBIFS file system but we didn't expect NAND blocks themselves to be marked as bad, due to power cut. What would cause large number of NAND blocks to be marked as bad, due to power cut? -Subodh