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Date: Mon, 13 May 2013 17:34:45 +0800
From: Huang Shijie <b32955@freescale.com>
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To: Stefan Roese <sr@denx.de>
Subject: Re: mtd_oobtest fails with GPMI-NAND
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Cc: Vikram Narayanan <vikram186@gmail.com>, linux-mtd@lists.infradead.org,
 Huang Shijie <b32955@freescale.com>
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=E4=BA=8E 2013=E5=B9=B405=E6=9C=8813=E6=97=A5 17:22, Stefan Roese =E5=86=99=
=E9=81=93:
> Done. But no errors in this test though. Even with increasing the
> cycles_count. I don't want to destroy this chip, so I'm not increasing
> the cycles too much.
If you can pass the bonnie++ stress test on the ubifs, it means the gpmi=20
works fine.

> Which NAND devices did you test with on imx6? Did you also tests with a
> "similar" Micron ONFI chip as this one (MT29F4G08ABADAH4)?
>
For micron's chips, I tested more then 10 chips. some chips show followin=
g :
Micron MT29F4G08ABADAWP (2048 + 64)

Micron MT29F8G08ABACAWP (4096 + 224)

Micron MT29F4G08ABAEAWP (4096 + 224)

Micron MT29F32G08QAA (4096 + 218)


But i do not test your chip. I do not have this chip, if i have, i can=20
test it on arm2/ard boards.


thanks
Huang Shijie