[PATCH v2 1/2] phy: hisilicon: Add inno-usb2-phy driver for Hi3798MV100

[David Yang <mmyangfl@gmail.com>]

Adopt existing phy-hisi-inno-usb2 driver to Hi3798MV100, with a slightly
different TEST register convention.

Signed-off-by: David Yang <mmyangfl@gmail.com>
---
 drivers/phy/hisilicon/phy-hisi-inno-usb2.c | 62 ++++++++++++++++------
 1 file changed, 46 insertions(+), 16 deletions(-)

diff --git a/drivers/phy/hisilicon/phy-hisi-inno-usb2.c b/drivers/phy/hisilicon/phy-hisi-inno-usb2.c
index b133ae06757a..15dafe359552 100644
--- a/drivers/phy/hisilicon/phy-hisi-inno-usb2.c
+++ b/drivers/phy/hisilicon/phy-hisi-inno-usb2.c
@@ -9,7 +9,7 @@
 #include <linux/delay.h>
 #include <linux/io.h>
 #include <linux/module.h>
-#include <linux/platform_device.h>
+#include <linux/of_device.h>
 #include <linux/phy/phy.h>
 #include <linux/reset.h>
 
@@ -20,12 +20,25 @@
 #define PHY_CLK_STABLE_TIME	2	/* unit:ms */
 #define UTMI_RST_COMPLETE_TIME	2	/* unit:ms */
 #define POR_RST_COMPLETE_TIME	300	/* unit:us */
+
+#define PHY_TYPE_0	0
+#define PHY_TYPE_1	1
+
 #define PHY_TEST_DATA		GENMASK(7, 0)
-#define PHY_TEST_ADDR		GENMASK(15, 8)
-#define PHY_TEST_PORT		GENMASK(18, 16)
-#define PHY_TEST_WREN		BIT(21)
-#define PHY_TEST_CLK		BIT(22)	/* rising edge active */
-#define PHY_TEST_RST		BIT(23)	/* low active */
+#define PHY_TEST_ADDR_OFFSET	8
+#define PHY0_TEST_ADDR		GENMASK(15, 8)
+#define PHY0_TEST_PORT_OFFSET	16
+#define PHY0_TEST_PORT		GENMASK(18, 16)
+#define PHY0_TEST_WREN		BIT(21)
+#define PHY0_TEST_CLK		BIT(22)	/* rising edge active */
+#define PHY0_TEST_RST		BIT(23)	/* low active */
+#define PHY1_TEST_ADDR		GENMASK(11, 8)
+#define PHY1_TEST_PORT_OFFSET	12
+#define PHY1_TEST_PORT		BIT(12)
+#define PHY1_TEST_WREN		BIT(13)
+#define PHY1_TEST_CLK		BIT(14)	/* rising edge active */
+#define PHY1_TEST_RST		BIT(15)	/* low active */
+
 #define PHY_CLK_ENABLE		BIT(2)
 
 struct hisi_inno_phy_port {
@@ -37,6 +50,7 @@ struct hisi_inno_phy_priv {
 	void __iomem *mmio;
 	struct clk *ref_clk;
 	struct reset_control *por_rst;
+	unsigned int type;
 	struct hisi_inno_phy_port ports[INNO_PHY_PORT_NUM];
 };
 
@@ -45,17 +59,27 @@ static void hisi_inno_phy_write_reg(struct hisi_inno_phy_priv *priv,
 {
 	void __iomem *reg = priv->mmio;
 	u32 val;
-
-	val = (data & PHY_TEST_DATA) |
-	      ((addr << 8) & PHY_TEST_ADDR) |
-	      ((port << 16) & PHY_TEST_PORT) |
-	      PHY_TEST_WREN | PHY_TEST_RST;
+	u32 value;
+
+	if (priv->type == PHY_TYPE_0)
+		val = (data & PHY_TEST_DATA) |
+		      ((addr << PHY_TEST_ADDR_OFFSET) & PHY0_TEST_ADDR) |
+		      ((port << PHY0_TEST_PORT_OFFSET) & PHY0_TEST_PORT) |
+		      PHY0_TEST_WREN | PHY0_TEST_RST;
+	else
+		val = (data & PHY_TEST_DATA) |
+		      ((addr << PHY_TEST_ADDR_OFFSET) & PHY1_TEST_ADDR) |
+		      ((port << PHY1_TEST_PORT_OFFSET) & PHY1_TEST_PORT) |
+		      PHY1_TEST_WREN | PHY1_TEST_RST;
 	writel(val, reg);
 
-	val |= PHY_TEST_CLK;
-	writel(val, reg);
+	value = val;
+	if (priv->type == PHY_TYPE_0)
+		value |= PHY0_TEST_CLK;
+	else
+		value |= PHY1_TEST_CLK;
+	writel(value, reg);
 
-	val &= ~PHY_TEST_CLK;
 	writel(val, reg);
 }
 
@@ -135,6 +159,8 @@ static int hisi_inno_phy_probe(struct platform_device *pdev)
 	if (IS_ERR(priv->por_rst))
 		return PTR_ERR(priv->por_rst);
 
+	priv->type = (uintptr_t) of_device_get_match_data(dev);
+
 	for_each_child_of_node(np, child) {
 		struct reset_control *rst;
 		struct phy *phy;
@@ -170,8 +196,12 @@ static int hisi_inno_phy_probe(struct platform_device *pdev)
 }
 
 static const struct of_device_id hisi_inno_phy_of_match[] = {
-	{ .compatible = "hisilicon,inno-usb2-phy", },
-	{ .compatible = "hisilicon,hi3798cv200-usb2-phy", },
+	{ .compatible = "hisilicon,inno-usb2-phy",
+	  .data = (void *) PHY_TYPE_0 },
+	{ .compatible = "hisilicon,hi3798cv200-usb2-phy",
+	  .data = (void *) PHY_TYPE_0 },
+	{ .compatible = "hisilicon,hi3798mv100-usb2-phy",
+	  .data = (void *) PHY_TYPE_1 },
 	{ },
 };
 MODULE_DEVICE_TABLE(of, hisi_inno_phy_of_match);
-- 
2.39.2


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