Re: [PATCH v3 22/27] staging: iio: resolver: ad2s1210: convert LOS threshold to event attr

Jonathan Cameron
2023-09-30T15:32:11Z

On Fri, 29 Sep 2023 12:23:27 -0500
David Lechner <dlechner@baylibre.com> wrote:

> From: David Lechner <david@lechnology.com>
>
> From: David Lechner <dlechner@baylibre.com>
>
> The AD2S1210 has a programmable threshold for the loss of signal (LOS)
> fault. This fault is triggered when either the sine or cosine input
> falls below the threshold voltage.
>
> This patch converts the custom device LOS threshold attribute to an
> event falling edge threshold attribute on a new monitor signal channel.
> The monitor signal is an internal signal that combines the amplitudes
> of the sine and cosine inputs as well as the current angle and position
> output. This signal is used to detect faults in the input signals.
>
> The attribute now uses millivolts instead of the raw register value in
> accordance with the IIO ABI.
>
> Emitting the event will be implemented in a later patch.
>
> Signed-off-by: David Lechner <dlechner@baylibre.com>

I think I'm fine with treating these internal signals like this, but
I would ideally like someone from Analog devices to take a look at how
these are being done and make sure our interpretations of the signals
make sense to them. We are pushing the boundaries a little here (though
we have done similar before for fault events I think.)

Jonathan