Re: [PATCH 9/6] generic/459: fix test running errors

[Eryu Guan <eguan@redhat.com>]

On Thu, Oct 26, 2017 at 05:44:46PM -0700, Darrick J. Wong wrote:
> If the DISCARD of the thin device somehow fails with this message:
> 
> device-mapper: thin: Data device (dm-1) discard unsupported: Disabling discard passdown.
> 
> Then we can end up with arbitrary gunk in the thin device.  This causes
> mkfs to fail because it's afraid to format the device.  Don't be afraid,
> just zap it.  FWIW mkfs.xfs thinks that the thinp device has an xfs
> external log because sometimes the thinp device just happen to be backed
> by the log of the previous test's scratch fs.
> 
> Signed-off-by: Darrick J. Wong <darrick.wong@oracle.com>
> ---
>  tests/generic/459 |    2 +-
>  1 file changed, 1 insertion(+), 1 deletion(-)
> 
> diff --git a/tests/generic/459 b/tests/generic/459
> index 7c10c2a..3dd3681 100755
> --- a/tests/generic/459
> +++ b/tests/generic/459
> @@ -92,7 +92,7 @@ $LVM_PROG lvcreate  --virtualsize $virtsize \
>  		    -T $vgname/$poolname \
>  		    -n $lvname >>$seqres.full 2>&1
>  
> -_mkfs_dev /dev/mapper/$vgname-$lvname >>$seqres.full 2>&1
> +_mkfs_dev -f /dev/mapper/$vgname-$lvname >>$seqres.full 2>&1

I think we should fix it in _mkfs_dev, add a new switch entry for xfs.

Thanks,
Eryu

>  
>  
>  # Running the test over the original volume doesn't reproduce the problem