Re: [PATCH] xfstests 299-305: remove fio config files after finished test

Zheng Liu
2013-03-20T05:22:49Z

On Tue, Mar 19, 2013 at 11:19:48AM -0500, Eric Sandeen wrote:
> On 3/19/13 4:30 AM, Zheng Liu wrote:
> > From: Zheng Liu <wenqing.lz@taobao.com>
> >
> > After finished test, temporarily fio config file should be removed.
>
> Looks fine, except that in test 300 you don't do rm -f; in every
> other test -f is used. Was that intentional?

Thanks for pointing it out. It's a typo. I will submit a newer patch
to fix it.

>
> Also, while looking at this, in 305 cleanup uses "poweron_scratch_dev"
> - is that defined anywhere? I can't find it.

Yeah, I also cannot find it. I am not sure why it is called here. I
will take a look at it and make sure that we can remove it.

Regards,
- Zheng