[PATCH AUTOSEL 4.19 06/36] tools/testing/nvdimm: Fix the array size for dimm devices.

Sasha Levin
2018-11-22T19:53:05Z

From: Masayoshi Mizuma <m.mizuma@jp.fujitsu.com>

[ Upstream commit af31b04b67f4fd7f639fd465a507c154c46fc9fb ]

KASAN reports following global out of bounds access while
nfit_test is being loaded. The out of bound access happens
the following reference to dimm_fail_cmd_flags[dimm]. 'dimm' is
over than the index value, NUM_DCR (==5).

static int override_return_code(int dimm, unsigned int func, int rc)
{
if ((1 << func) & dimm_fail_cmd_flags[dimm]) {

dimm_fail_cmd_flags[] definition:
static unsigned long dimm_fail_cmd_flags[NUM_DCR];

'dimm' is the return value of get_dimm(), and get_dimm() returns
the index of handle[] array. The handle[] has 7 index. Let's use
ARRAY_SIZE(handle) as the array size.

KASAN report:

==================================================================
BUG: KASAN: global-out-of-bounds in nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
Read of size 8 at addr ffffffffc10cbbe8 by task kworker/u41:0/8
...
Call Trace:
dump_stack+0xea/0x1b0
? dump_stack_print_info.cold.0+0x1b/0x1b
? kmsg_dump_rewind_nolock+0xd9/0xd9
print_address_description+0x65/0x22e
? nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
kasan_report.cold.6+0x92/0x1a6
nfit_test_ctl+0x47bb/0x55b0 [nfit_test]
...
The buggy address belongs to the variable:
dimm_fail_cmd_flags+0x28/0xffffffffffffa440 [nfit_test]
==================================================================

Fixes: 39611e83a28c ("tools/testing/nvdimm: Make DSM failure code injection...")
Signed-off-by: Masayoshi Mizuma <m.mizuma@jp.fujitsu.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Signed-off-by: Sasha Levin <sashal@kernel.org>
---
tools/testing/nvdimm/test/nfit.c | 8 ++++----
1 file changed, 4 insertions(+), 4 deletions(-)

diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c
index cffc2c5a778d..ec50d2a95076 100644
--- a/tools/testing/nvdimm/test/nfit.c
+++ b/tools/testing/nvdimm/test/nfit.c
@@ -139,8 +139,8 @@ static u32 handle[] = {
[6] = NFIT_DIMM_HANDLE(1, 0, 0, 0, 1),
};

-static unsigned long dimm_fail_cmd_flags[NUM_DCR];
-static int dimm_fail_cmd_code[NUM_DCR];
+static unsigned long dimm_fail_cmd_flags[ARRAY_SIZE(handle)];
+static int dimm_fail_cmd_code[ARRAY_SIZE(handle)];

static const struct nd_intel_smart smart_def = {
.flags = ND_INTEL_SMART_HEALTH_VALID
@@ -203,7 +203,7 @@ struct nfit_test {
unsigned long deadline;
spinlock_t lock;
} ars_state;
- struct device *dimm_dev[NUM_DCR];
+ struct device *dimm_dev[ARRAY_SIZE(handle)];
struct nd_intel_smart *smart;
struct nd_intel_smart_threshold *smart_threshold;
struct badrange badrange;
@@ -2678,7 +2678,7 @@ static int nfit_test_probe(struct platform_device *pdev)
u32 nfit_handle = __to_nfit_memdev(nfit_mem)->device_handle;
int i;

- for (i = 0; i < NUM_DCR; i++)
+ for (i = 0; i < ARRAY_SIZE(handle); i++)
if (nfit_handle == handle[i])
dev_set_drvdata(nfit_test->dimm_dev[i],
nfit_mem);
--
2.17.1