Re: [PATCH -next] ndtest: Fix incorrect handling for return value of device_create_with_groups.

[Dave Jiang <dave.jiang@intel.com>]

On 9/8/25 5:23 AM, Lin Yujun wrote:
> The return value of device_create_with_groups will not
> be an null pointer, use IS_ERR() to fix incorrect handling
> return value of device_create_with_groups.
> 
> Fixes: 9399ab61ad82 ("ndtest: Add dimms to the two buses")
> Signed-off-by: Lin Yujun <linyujun809@h-partners.com>

Reviewed-by: Dave Jiang <dave.jiang@intel.com>
> ---
>  tools/testing/nvdimm/test/ndtest.c | 2 +-
>  1 file changed, 1 insertion(+), 1 deletion(-)
> 
> diff --git a/tools/testing/nvdimm/test/ndtest.c b/tools/testing/nvdimm/test/ndtest.c
> index 68a064ce598c..7d722f2f7d62 100644
> --- a/tools/testing/nvdimm/test/ndtest.c
> +++ b/tools/testing/nvdimm/test/ndtest.c
> @@ -745,11 +745,11 @@ static int ndtest_dimm_register(struct ndtest_priv *priv,
>  
>  	dimm->dev = device_create_with_groups(&ndtest_dimm_class,
>  					     &priv->pdev.dev,
>  					     0, dimm, dimm_attribute_groups,
>  					     "test_dimm%d", id);
> -	if (!dimm->dev) {
> +	if (IS_ERR(dimm->dev)) {
>  		pr_err("Could not create dimm device attributes\n");
>  		return -ENOMEM;
>  	}
>  
>  	return 0;