* [PATCH -next] ndtest: Fix incorrect handling for return value of device_create_with_groups.
@ 2025-09-08 12:23 Lin Yujun
2025-09-08 17:47 ` Dave Jiang
0 siblings, 1 reply; 2+ messages in thread
From: Lin Yujun @ 2025-09-08 12:23 UTC (permalink / raw)
To: dan.j.williams, vishal.l.verma, dave.jiang, ira.weiny,
linyujun809, santosh
Cc: nvdimm, linux-kernel
The return value of device_create_with_groups will not
be an null pointer, use IS_ERR() to fix incorrect handling
return value of device_create_with_groups.
Fixes: 9399ab61ad82 ("ndtest: Add dimms to the two buses")
Signed-off-by: Lin Yujun <linyujun809@h-partners.com>
---
tools/testing/nvdimm/test/ndtest.c | 2 +-
1 file changed, 1 insertion(+), 1 deletion(-)
diff --git a/tools/testing/nvdimm/test/ndtest.c b/tools/testing/nvdimm/test/ndtest.c
index 68a064ce598c..7d722f2f7d62 100644
--- a/tools/testing/nvdimm/test/ndtest.c
+++ b/tools/testing/nvdimm/test/ndtest.c
@@ -745,11 +745,11 @@ static int ndtest_dimm_register(struct ndtest_priv *priv,
dimm->dev = device_create_with_groups(&ndtest_dimm_class,
&priv->pdev.dev,
0, dimm, dimm_attribute_groups,
"test_dimm%d", id);
- if (!dimm->dev) {
+ if (IS_ERR(dimm->dev)) {
pr_err("Could not create dimm device attributes\n");
return -ENOMEM;
}
return 0;
--
2.34.1
^ permalink raw reply related [flat|nested] 2+ messages in thread
* Re: [PATCH -next] ndtest: Fix incorrect handling for return value of device_create_with_groups.
2025-09-08 12:23 [PATCH -next] ndtest: Fix incorrect handling for return value of device_create_with_groups Lin Yujun
@ 2025-09-08 17:47 ` Dave Jiang
0 siblings, 0 replies; 2+ messages in thread
From: Dave Jiang @ 2025-09-08 17:47 UTC (permalink / raw)
To: Lin Yujun, dan.j.williams, vishal.l.verma, ira.weiny, santosh
Cc: nvdimm, linux-kernel
On 9/8/25 5:23 AM, Lin Yujun wrote:
> The return value of device_create_with_groups will not
> be an null pointer, use IS_ERR() to fix incorrect handling
> return value of device_create_with_groups.
>
> Fixes: 9399ab61ad82 ("ndtest: Add dimms to the two buses")
> Signed-off-by: Lin Yujun <linyujun809@h-partners.com>
Reviewed-by: Dave Jiang <dave.jiang@intel.com>
> ---
> tools/testing/nvdimm/test/ndtest.c | 2 +-
> 1 file changed, 1 insertion(+), 1 deletion(-)
>
> diff --git a/tools/testing/nvdimm/test/ndtest.c b/tools/testing/nvdimm/test/ndtest.c
> index 68a064ce598c..7d722f2f7d62 100644
> --- a/tools/testing/nvdimm/test/ndtest.c
> +++ b/tools/testing/nvdimm/test/ndtest.c
> @@ -745,11 +745,11 @@ static int ndtest_dimm_register(struct ndtest_priv *priv,
>
> dimm->dev = device_create_with_groups(&ndtest_dimm_class,
> &priv->pdev.dev,
> 0, dimm, dimm_attribute_groups,
> "test_dimm%d", id);
> - if (!dimm->dev) {
> + if (IS_ERR(dimm->dev)) {
> pr_err("Could not create dimm device attributes\n");
> return -ENOMEM;
> }
>
> return 0;
^ permalink raw reply [flat|nested] 2+ messages in thread
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