Re: [PATCH 0/4] mmc: dw_mmc: mmc_test related fixes

[Jaehoon Chung <jh80.chung@samsung.com>]

Tested-by: Jaehoon Chung <jh80.chung@samsung.com>

Will Newton wrote:
> On Wed, Jun 29, 2011 at 9:27 AM, James Hogan <james.hogan@imgtec.com> wrote:
>> More improvements and fixes for the Synopsys DesignWare MCI driver so
>> that it passes the mmc_test suite:
>>
>> [PATCH 1/4] mmc: dw_mmc: fix stop when fallen back to PIO
>>        Fixes a hang after an error/timeout in PIO mode.
>> [PATCH 2/4] mmc: dw_mmc: remove unnecessary error messages
>>        Removes some dev_err's since an errno is sufficient.
>> [PATCH 3/4] mmc: dw_mmc: handle "no CRC status" error
>>        Fixes "Correct xfer_size at write" tests.
>> [PATCH 4/4] mmc: dw_mmc: reset FIFO after an error
>>        Fixes modified "Correct xfer_size at write" tests (3 blocks
>>        instead of 2).
>>
>>  drivers/mmc/host/dw_mmc.c  |   41 +++++++++++++++++++++++++++++++----------
>>  include/linux/mmc/dw_mmc.h |    2 ++
>>  2 files changed, 33 insertions(+), 10 deletions(-)
> 
> These all look good to me.
> 
> Acked-by: Will Newton <will.newton@imgtec.com>
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