Re: [PATCH v10 2/5] mtd: nand: vf610_nfc: add hardware BCH-ECC support

Brian Norris
2015-08-25T19:54:18Z

On Mon, Aug 03, 2015 at 11:28:43AM +0200, Stefan Agner wrote:
> On 2015-08-03 11:27, Stefan Agner wrote:
> <snip>
> > +static inline int vf610_nfc_correct_data(struct mtd_info *mtd, uint8_t *dat,
> > + uint8_t *oob, int oob_loaded)
> > +{
> > + struct vf610_nfc *nfc = mtd_to_nfc(mtd);
> > + u8 ecc_status;
> > + u8 ecc_count;
> > + int flip;
> > +
> > + ecc_status = __raw_readb(nfc->regs + ECC_SRAM_ADDR * 8 + ECC_OFFSET);

Why __raw_readb()? That's not normally encourage, and it has issues with
endianness. It looks like maybe this is actulaly a 32-bit register, and
you're having trouble when trying to do bytewise access? I see this
earlier:

/*
* ECC status is stored at NFC_CFG[ECCADD] +4 for little-endian
* and +7 for big-endian SoCs.
*/
#ifdef __LITTLE_ENDIAN
#define ECC_OFFSET 4
#else
#define ECC_OFFSET 7
#endif

So maybe you really just want:

#define ECC_OFFSET 4
...
ecc_status = vf610_nfc_read(ECC_SRAM_ADDR * 8 + ECC_OFFSET) & 0xff;

?

> > + ecc_count = ecc_status & ECC_ERR_COUNT;
> > +
> > + if (!(ecc_status & ECC_STATUS_MASK))
> > + return ecc_count;
> > +
> > + if (!oob_loaded)
> > + vf610_nfc_read_buf(mtd, oob, mtd->oobsize);
> > +
> > + /*
> > + * On an erased page, bit count (including OOB) should be zero or
> > + * at least less then half of the ECC strength.
> > + */
> > + flip = count_written_bits(dat, nfc->chip.ecc.size, ecc_count);

Another side note: why are you using ecc_count as a max threshold? AIUI,
an ECC algorithm doesn't really report useful error count information if
it's above the correction limit. So wouldn't we be looking to count up
to our SW threshold? i.e., ecc.strength / 2, or similar? Similar
comments below.

> > + flip += count_written_bits(oob, mtd->oobsize - nfc->chip.ecc.bytes,
> > + ecc_count);
>
> With ECC the controller seems to clear the ECC bytes in SRAM buffer.
> This is a dump of 64 Bit OOB with the 32-error ECC mode which requires
> 60 bytes of OOB for ECC:
>
> [ 22.190273] ff ff ff ff 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00
> 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00
> 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00

Hmm, that's not really good. The point is that we need to make sure that
everything that could have been programmed (including the ECC area) was
not actually programmed. But your ECC controller is not, contrary to
MTD's expectations, dumping raw uncorrected data here.

> [ 22.209698] vf610_nfc_correct_data, flips 1
>
> Not sure if this is acceptable, but I now only count the bits in the
> non-ECC area of the OOB.

That's not the intention of my suggestion. You're still missing out on a
class of patterns that might look close to all 0xff but are not
actually.

If the HW ECC really doesn't give you valid data+OOB at this point, then
you might have to re-read with ECC disabled. Of course, that's got a
performance cost...

Or perhaps Boris has a better suggestion? He's been surveying other NAND
drivers that need to do similar things, and he's working on providing
some support code for common design patterns.

> Btw, if the ECC check fails, the controller seems kind of count the
> amount of bitflips. It works for most devices reliable, but we had
> devices for which that number was not accurate, see:
> http://thread.gmane.org/gmane.linux.ports.arm.kernel/357439

I'm a little confused there. Why would you be expecting to get a count
of bitflips, when the ECC engine can't correct all errors? How is it
supposed to know what the "right" data is if the bit errors are beyond
the correction strength?

Brian