Re: [LTP] [PATCH] Make the test result codes a real bitfield again

Subrata Modak
2009-08-03T13:43:07Z

Mike,

You would need to see this.

Regards--
Subrata

On Thu, 2009-07-30 at 11:57 +0200, Jiri Palecek wrote:
> Hello,
>
> the commit "extend the test result to a bit field so we can extend the output further" from July 20th unfortunately changes the code, that was previously a bitfield, to a non-bitfield. This causes FAILED tests to return erroneously 0.
>
> This patch changes the test result codes to be individual bits in the bitfield (effectively reverting a small part of aforementioned patch).
>
> Regards
> Jiri Palecek
>
> ---
> include/test.h | 12 ++++++------
> 1 files changed, 6 insertions(+), 6 deletions(-)
>
> diff --git a/include/test.h b/include/test.h
> index 5c325b3..4d9803a 100644
> --- a/include/test.h
> +++ b/include/test.h
> @@ -44,15 +44,15 @@
>
> #include "compiler.h"
>
> -/* Use low 4 bits to encode test type */
> -#define TTYPE_MASK 0xf
> +/* Use low 6 bits to encode test type */
> +#define TTYPE_MASK 0x3f
> #define TPASS 0 /* Test passed flag */
> #define TFAIL 1 /* Test failed flag */
> #define TBROK 2 /* Test broken flag */
> -#define TWARN 3 /* Test warning flag */
> -#define TRETR 4 /* Test retire flag */
> -#define TINFO 5 /* Test information flag */
> -#define TCONF 6 /* Test not appropriate for configuration flag */
> +#define TWARN 4 /* Test warning flag */
> +#define TRETR 8 /* Test retire flag */
> +#define TINFO 16 /* Test information flag */
> +#define TCONF 32 /* Test not appropriate for configuration flag */
> #define TTYPE_RESULT(ttype) ((ttype) & TTYPE_MASK)
>
> #define TERRNO 0x100 /* Append errno information to output */