From mboxrd@z Thu Jan 1 00:00:00 1970 From: Li Wang Date: Wed, 14 Jun 2017 11:38:30 +0800 Subject: [LTP] [PATCH] dio: reduce the number of cycles Message-ID: <20170614033830.12736-1-liwang@redhat.com> List-Id: MIME-Version: 1.0 Content-Type: text/plain; charset="us-ascii" Content-Transfer-Encoding: 7bit To: ltp@lists.linux.it These two cases (dio29/30) takes a bit long time in dio test, but they're not stress test, so I suggest reducing the number of cycles. On my RHEL-7.3 (23G RAM, 24 CPU(s), x86_64) box, it takes almost 9 mins. diotest06 1 TPASS : Read with Direct IO, Write without diotest06 2 TPASS : Write with Direct IO, Read without diotest06 3 TPASS : Read, Write with Direct IO diotest06 0 TINFO : 3 testblocks 1000 iterations with 100 children completed real 8m4.805s user 71m36.722s sys 8m51.649s Signed-off-by: Li Wang --- runtest/dio | 4 ++-- 1 file changed, 2 insertions(+), 2 deletions(-) diff --git a/runtest/dio b/runtest/dio index a26e001..185cd57 100644 --- a/runtest/dio +++ b/runtest/dio @@ -40,8 +40,8 @@ dio27 diotest6 -b 8192 -o 1024000 -i 1000 -v 100 dio28 diotest6 -b 8192 -o 1024000 -i 1000 -v 200 ### Run the tests with more children -dio29 diotest3 -b 65536 -n 100 -i 1000 -o 1024000 -dio30 diotest6 -b 65536 -n 100 -i 1000 -o 1024000 +dio29 diotest3 -b 65536 -n 100 -i 100 -o 1024000 +dio30 diotest6 -b 65536 -n 100 -i 100 -o 1024000 # # RAW DEVICE TEST SECTION # DEV1 and DEV2 should be exported prior to execution or -- 2.9.3