[LTP] [PATCH] dio: reduce the number of cycles

[Eryu Guan <eguan@redhat.com>]

On Wed, Jun 14, 2017 at 11:38:30AM +0800, Li Wang wrote:
> These two cases (dio29/30) takes a bit long time in dio test, but they're not stress
> test, so I suggest reducing the number of cycles.
> 
> On my RHEL-7.3 (23G RAM, 24 CPU(s), x86_64) box, it takes almost 9 mins.
> 
>   diotest06    1  TPASS  :  Read with Direct IO, Write without
>   diotest06    2  TPASS  :  Write with Direct IO, Read without
>   diotest06    3  TPASS  :  Read, Write with Direct IO
>   diotest06    0  TINFO  :  3 testblocks 1000 iterations with 100 children completed
> 
>   real	8m4.805s
>   user	71m36.722s
>   sys	8m51.649s
> 
> Signed-off-by: Li Wang <liwang@redhat.com>

I tested diotest30 with 100 iterations and it still could reproduce the
bug I was seeing on 4.10 kernel quite reliably (even if not 100%), so

Acked-by: Eryu Guan <eguan@redhat.com>

> ---
>  runtest/dio | 4 ++--
>  1 file changed, 2 insertions(+), 2 deletions(-)
> 
> diff --git a/runtest/dio b/runtest/dio
> index a26e001..185cd57 100644
> --- a/runtest/dio
> +++ b/runtest/dio
> @@ -40,8 +40,8 @@ dio27 diotest6 -b 8192 -o 1024000 -i 1000 -v 100
>  dio28 diotest6 -b 8192 -o 1024000 -i 1000 -v 200
>  
>  ### Run the tests with more children
> -dio29 diotest3 -b 65536 -n 100 -i 1000 -o 1024000
> -dio30 diotest6 -b 65536 -n 100 -i 1000 -o 1024000
> +dio29 diotest3 -b 65536 -n 100 -i 100 -o 1024000
> +dio30 diotest6 -b 65536 -n 100 -i 100 -o 1024000
>  #
>  # RAW DEVICE TEST SECTION
>  #   DEV1 and DEV2 should be exported prior to execution or
> -- 
> 2.9.3
>