Re: [LTP] [PATCH] Make the test result codes a real bitfield again

Re: [LTP] [PATCH] Make the test result codes a real bitfield again

[Subrata Modak]

Mike,

You would need to see this.

Regards--
Subrata

On Thu, 2009-07-30 at 11:57 +0200, Jiri Palecek wrote: 
> Hello,
> 
> the commit "extend the test result to a bit field so we can extend the output further" from July 20th unfortunately changes the code, that was previously a bitfield, to a non-bitfield. This causes FAILED tests to return erroneously 0.
> 
> This patch changes the test result codes to be individual bits in the bitfield (effectively reverting  a small part of aforementioned patch).
> 
> Regards
>     Jiri Palecek
> 
> ---
>  include/test.h |   12 ++++++------
>  1 files changed, 6 insertions(+), 6 deletions(-)
> 
> diff --git a/include/test.h b/include/test.h
> index 5c325b3..4d9803a 100644
> --- a/include/test.h
> +++ b/include/test.h
> @@ -44,15 +44,15 @@
> 
>  #include "compiler.h"
> 
> -/* Use low 4 bits to encode test type */
> -#define TTYPE_MASK 0xf
> +/* Use low 6 bits to encode test type */
> +#define TTYPE_MASK 0x3f
>  #define TPASS      0    /* Test passed flag */
>  #define TFAIL      1    /* Test failed flag */
>  #define TBROK      2    /* Test broken flag */
> -#define TWARN      3    /* Test warning flag */
> -#define TRETR      4    /* Test retire flag */
> -#define TINFO      5    /* Test information flag */
> -#define TCONF      6    /* Test not appropriate for configuration flag */
> +#define TWARN      4    /* Test warning flag */
> +#define TRETR      8    /* Test retire flag */
> +#define TINFO      16   /* Test information flag */
> +#define TCONF      32   /* Test not appropriate for configuration flag */
>  #define TTYPE_RESULT(ttype) ((ttype) & TTYPE_MASK)
> 
>  #define TERRNO     0x100   /* Append errno information to output */


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Re: [LTP] [PATCH] Make the test result codes a real bitfield again

[Michal Simek]

Hi Mike and Subrata,
> Mike,
>
> You would need to see this.
>   
Jiri is right. I sent one email about some minutes ago (but not solution).
Please ignore my email and add this change. I tested it and works.

BTW: I haven't seen that Mike's patches on mailing list.

Thanks,
Michal

> Regards--
> Subrata
>
> On Thu, 2009-07-30 at 11:57 +0200, Jiri Palecek wrote: 
>   
>> Hello,
>>
>> the commit "extend the test result to a bit field so we can extend the output further" from July 20th unfortunately changes the code, that was previously a bitfield, to a non-bitfield. This causes FAILED tests to return erroneously 0.
>>
>> This patch changes the test result codes to be individual bits in the bitfield (effectively reverting  a small part of aforementioned patch).
>>
>> Regards
>>     Jiri Palecek
>>
>> ---
>>  include/test.h |   12 ++++++------
>>  1 files changed, 6 insertions(+), 6 deletions(-)
>>
>> diff --git a/include/test.h b/include/test.h
>> index 5c325b3..4d9803a 100644
>> --- a/include/test.h
>> +++ b/include/test.h
>> @@ -44,15 +44,15 @@
>>
>>  #include "compiler.h"
>>
>> -/* Use low 4 bits to encode test type */
>> -#define TTYPE_MASK 0xf
>> +/* Use low 6 bits to encode test type */
>> +#define TTYPE_MASK 0x3f
>>  #define TPASS      0    /* Test passed flag */
>>  #define TFAIL      1    /* Test failed flag */
>>  #define TBROK      2    /* Test broken flag */
>> -#define TWARN      3    /* Test warning flag */
>> -#define TRETR      4    /* Test retire flag */
>> -#define TINFO      5    /* Test information flag */
>> -#define TCONF      6    /* Test not appropriate for configuration flag */
>> +#define TWARN      4    /* Test warning flag */
>> +#define TRETR      8    /* Test retire flag */
>> +#define TINFO      16   /* Test information flag */
>> +#define TCONF      32   /* Test not appropriate for configuration flag */
>>  #define TTYPE_RESULT(ttype) ((ttype) & TTYPE_MASK)
>>
>>  #define TERRNO     0x100   /* Append errno information to output */
>>     
>
>
> ------------------------------------------------------------------------------
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> trial. Simplify your report design, integration and deployment - and focus on 
> what you do best, core application coding. Discover what's new with 
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> https://lists.sourceforge.net/lists/listinfo/ltp-list
>   


-- 
Michal Simek, Ing. (M.Eng)
PetaLogix - Linux Solutions for a Reconfigurable World
w: www.petalogix.com p: +61-7-30090663,+42-0-721842854 f: +61-7-30090663


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Re: [LTP] [PATCH] Make the test result codes a real bitfield again

[Subrata Modak]

On Mon, 2009-08-03 at 16:42 +0200, Michal Simek wrote: 
> Hi Mike and Subrata,
> > Mike,
> >
> > You would need to see this.
> >   
> Jiri is right. I sent one email about some minutes ago (but not solution).
> Please ignore my email and add this change. I tested it and works.

Thanks. Did it.

Regards--
Subrata

> 
> BTW: I haven't seen that Mike's patches on mailing list.
> 
> Thanks,
> Michal
> 
> > Regards--
> > Subrata
> >
> > On Thu, 2009-07-30 at 11:57 +0200, Jiri Palecek wrote: 
> >   
> >> Hello,
> >>
> >> the commit "extend the test result to a bit field so we can extend the output further" from July 20th unfortunately changes the code, that was previously a bitfield, to a non-bitfield. This causes FAILED tests to return erroneously 0.
> >>
> >> This patch changes the test result codes to be individual bits in the bitfield (effectively reverting  a small part of aforementioned patch).
> >>
> >> Regards
> >>     Jiri Palecek
> >>
> >> ---
> >>  include/test.h |   12 ++++++------
> >>  1 files changed, 6 insertions(+), 6 deletions(-)
> >>
> >> diff --git a/include/test.h b/include/test.h
> >> index 5c325b3..4d9803a 100644
> >> --- a/include/test.h
> >> +++ b/include/test.h
> >> @@ -44,15 +44,15 @@
> >>
> >>  #include "compiler.h"
> >>
> >> -/* Use low 4 bits to encode test type */
> >> -#define TTYPE_MASK 0xf
> >> +/* Use low 6 bits to encode test type */
> >> +#define TTYPE_MASK 0x3f
> >>  #define TPASS      0    /* Test passed flag */
> >>  #define TFAIL      1    /* Test failed flag */
> >>  #define TBROK      2    /* Test broken flag */
> >> -#define TWARN      3    /* Test warning flag */
> >> -#define TRETR      4    /* Test retire flag */
> >> -#define TINFO      5    /* Test information flag */
> >> -#define TCONF      6    /* Test not appropriate for configuration flag */
> >> +#define TWARN      4    /* Test warning flag */
> >> +#define TRETR      8    /* Test retire flag */
> >> +#define TINFO      16   /* Test information flag */
> >> +#define TCONF      32   /* Test not appropriate for configuration flag */
> >>  #define TTYPE_RESULT(ttype) ((ttype) & TTYPE_MASK)
> >>
> >>  #define TERRNO     0x100   /* Append errno information to output */
> >>     
> >
> >
> > ------------------------------------------------------------------------------
> > Let Crystal Reports handle the reporting - Free Crystal Reports 2008 30-Day 
> > trial. Simplify your report design, integration and deployment - and focus on 
> > what you do best, core application coding. Discover what's new with 
> > Crystal Reports now.  http://p.sf.net/sfu/bobj-july
> > _______________________________________________
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> > Ltp-list@lists.sourceforge.net
> > https://lists.sourceforge.net/lists/listinfo/ltp-list
> >   
> 
> 


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Re: [LTP] [PATCH] Make the test result codes a real bitfield again

[Mike Frysinger]

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On Thursday 30 July 2009 05:57:54 Jiri Palecek wrote:
> the commit "extend the test result to a bit field so we can extend the
> output further" from July 20th unfortunately changes the code, that was
> previously a bitfield, to a non-bitfield. This causes FAILED tests to
> return erroneously 0.
>
> This patch changes the test result codes to be individual bits in the
> bitfield (effectively reverting  a small part of aforementioned patch).

what tests exactly are failing ?  where/why is this causing a problem ?  i 
cant imagine a bit field being used for these values to really be necessary 
considering their values are mutually exclusive.
-mike

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[LTP] [PATCH] Make the test result codes a real bitfield again

[Jiri Palecek]

Hello,

the commit "extend the test result to a bit field so we can extend the output further" from July 20th unfortunately changes the code, that was previously a bitfield, to a non-bitfield. This causes FAILED tests to return erroneously 0.

This patch changes the test result codes to be individual bits in the bitfield (effectively reverting  a small part of aforementioned patch).

Regards
    Jiri Palecek

---
 include/test.h |   12 ++++++------
 1 files changed, 6 insertions(+), 6 deletions(-)

diff --git a/include/test.h b/include/test.h
index 5c325b3..4d9803a 100644
--- a/include/test.h
+++ b/include/test.h
@@ -44,15 +44,15 @@
 
 #include "compiler.h"
 
-/* Use low 4 bits to encode test type */
-#define TTYPE_MASK 0xf
+/* Use low 6 bits to encode test type */
+#define TTYPE_MASK 0x3f
 #define TPASS      0    /* Test passed flag */
 #define TFAIL      1    /* Test failed flag */
 #define TBROK      2    /* Test broken flag */
-#define TWARN      3    /* Test warning flag */
-#define TRETR      4    /* Test retire flag */
-#define TINFO      5    /* Test information flag */
-#define TCONF      6    /* Test not appropriate for configuration flag */
+#define TWARN      4    /* Test warning flag */
+#define TRETR      8    /* Test retire flag */
+#define TINFO      16   /* Test information flag */
+#define TCONF      32   /* Test not appropriate for configuration flag */
 #define TTYPE_RESULT(ttype) ((ttype) & TTYPE_MASK)
 
 #define TERRNO     0x100   /* Append errno information to output */
-- 
1.6.3.3




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