[U-Boot-Users] Memory Testing (Flash,EEPROM)

[U-Boot-Users] Memory Testing (Flash,EEPROM)

[Vikrant_Basotra]

Hi,

            The u-boot code (version 1.1.1) contains the SDRAM testing code.
The Test cases involved for the SDRAM are Address Bus Test, Data Bus Test
and Device Integrity Test. For SDRAM each and every thing is OK, but for
EEPROM and Flash Memory No such test Cases are their using which the user
can check the correctness of these Devices at the command prompt. It would
be highly appreciated if any one will describe the process of Flash memory
and EEPROM Testing by modifying the U-Boot Code.

Thanks in anticipation.

Regards!!!

Vikrant

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[U-Boot-Users] Memory Testing (Flash,EEPROM)

[Wolfgang Denk]

In message <3D9FDCA910DD4445896A0BE5ECF009D40176845A@bla.satyam.com> you wrote:
> 
> and Device Integrity Test. For SDRAM each and every thing is OK, but for
> EEPROM and Flash Memory No such test Cases are their using which the user
> can check the correctness of these Devices at the command prompt. It would
> be highly appreciated if any one will describe the process of Flash memory
> and EEPROM Testing by modifying the U-Boot Code.

It is up to you to define your requirements that such tests must meet.

It makes no real sense to perform a write testing  on  flash  memory,
for  example,  as  you must erase the flash to write it, and erase it
again to write it again, and the fact that you can write it now is no
guarantee that it is still erasable the next time.

U-Boot offers to check the integrity of the stiored data using  CRC32
checksums; this is even integral part of the U-Boot images.

If you need more or other features: feel free to add those.

Best regards,

Wolfgang Denk

-- 
See us @ Embedded/Electronica Munich, Nov 09 - 12, Hall A.6 Booth 513
Phone: (+49)-8142-66989-10 Fax: (+49)-8142-66989-80 Email: wd at denx.de
What is research but a blind date with knowledge?      -- Will Harvey

[U-Boot-Users] Memory Testing (Flash,EEPROM)

[Fillod Stephane]

Wolfgang Denk wrote:
> It makes no real sense to perform a write testing  on  flash  memory,
> for  example,  as  you must erase the flash to write it, and erase it
> again to write it again, and the fact that you can write it now is no
> guarantee that it is still erasable the next time.

IMHO, the point is not to test the chip, but to test the wires to the chip,
for industrial purpose.

For the other matters, the customer will find it out by himself anyway :*)


Best Regards,

-- 
Stephane

[U-Boot-Users] Memory Testing (Flash,EEPROM)

[Wolfgang Denk]

In message <1CFEB358338412458B21FAA0D78FE86D4F0C68@rennsmail02.eu.thmulti.com> you wrote:
> Wolfgang Denk wrote:
> > It makes no real sense to perform a write testing  on  flash  memory,
> > for  example,  as  you must erase the flash to write it, and erase it
> > again to write it again, and the fact that you can write it now is no
> > guarantee that it is still erasable the next time.
> 
> IMHO, the point is not to test the chip, but to test the wires to the chip,
> for industrial purpose.

You don't want to do this  in  software  -  software  can  only  test
certain  functions,  but not all connections. For that you want to do
standard hardware verification procedures like boundary scan etc.

> For the other matters, the customer will find it out by himself anyway :*)

Indeed ;-)

Best regards,

Wolfgang Denk

-- 
See us @ Embedded/Electronica Munich, Nov 09 - 12, Hall A.6 Booth 513
Phone: (+49)-8142-66989-10 Fax: (+49)-8142-66989-80 Email: wd at denx.de
Successful and fortunate crime is called virtue.             - Seneca