From mboxrd@z Thu Jan  1 00:00:00 1970
From: Stefan Roese <sr@denx.de>
Date: Thu, 10 Jan 2008 18:46:12 +0100
Subject: [U-Boot-Users] NAND driver updates
In-Reply-To: <200801100645.01940.sr@denx.de>
References: <1199548463-15543-1-git-send-email-sr@denx.de>
	<200801100003.06519.matthias.fuchs@esd-electronics.com>
	<200801100645.01940.sr@denx.de>
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On Thursday 10 January 2008, Stefan Roese wrote:
> > New:
> > ...
> > FLASH:  1 MB
> > NAND:  NAND device: Manufacturer ID: 0xec, Chip ID: 0x75 (Samsung NAND
> > 32MiB 3,3V 8-bit) Scanning device for bad blocks
> > Bad eraseblock 261 at 0x00414000
> > Bad eraseblock 352 at 0x00580000
> > Bad eraseblock 846 at 0x00d38000
> > Bad eraseblock 848 at 0x00d40000
> > 32 MiB
> > PCI:   Bus Dev VenId DevId Class Int
> > ...
> >
> > Perhaps we should calme is down by using the option
> > 'CFG_NAND_QUIET_TEST'. Also the formatting of the output is not very
> > pretty.
>
> Yes, we should remove those lines. I suggest to use debug() for here, so
> that they are printed when DEBUG is defined.

I already changed this in the NAND custodian repo.

Best regards,
Stefan

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