Re: [RFC/PATCH 2/2] usb: ehci: Add support for SINGLE_STEP_SET_FEATURE test of EHSET

[Greg KH <greg@kroah.com>]

On Tue, Jul 02, 2013 at 08:13:52PM -0700, Jack Pham wrote:
> From: Manu Gautam <mgautam@codeaurora.org>
> 
> The USB Embedded High-speed Host Electrical Test (EHSET) defines the
> SINGLE_STEP_SET_FEATURE test as follows:
> 
> 1) The host enumerates the test device with VID:0x1A0A, PID:0x0108
> 2) The host sends the SETUP stage of a GetDescriptor(Device)
> 3) The device ACKs the request
> 4) The host issues SOFs for 15 seconds allowing the test operator to
>    raise the scope trigger just above the SOF voltage level
> 5) The host sends the IN packet
> 6) The device sends data in response, triggering the scope
> 7) The host sends an ACK in response to the data
> 
> This patch adds additional handling to the EHCI hub driver and allows
> the EHSET driver to initiate this test mode by issuing a a SetFeature
> request to the root hub with a Test Selector value of 0x06. From there
> it mimics ehci_urb_enqueue() but separately submits QTDs for the
> SETUP and DATA/STATUS stages in order to insert a delay in between.
> 
> Signed-off-by: Manu Gautam <mgautam@codeaurora.org>
> Signed-off-by: Jack Pham <jackp@codeaurora.org>

Alan, any thoughts about this patch?

thanks,

greg k-h