[PATCH v2] ahci: imx: Handle increased read failures for IMX53 temperature sensor in low frequency mode.

[PATCH v2] ahci: imx: Handle increased read failures for IMX53 temperature sensor in low frequency mode.

[Martyn Welch]

From: Egor Starkov <egor.starkov@ge.com>

Extended testing has shown that the imx ahci driver sometimes requires
more than the 100 attempts currently alotted in the driver to perform a
successful temperature reading when running at minimum (throttled) CPU
frequency.

Debugging suggests that the read cycle can take 160 attempts (which given
that the driver averages 80 readings from the ADC equates to one failure
on each read).

Increase the attempt limit to 200 in order to greatly reduce the
likelihood of the driver failing to perform a temperature reading,
especially at low CPU frequency.

Signed-off-by: Egor Starkov <egor.starkov@ge.com>
Signed-off-by: Martyn Welch <martyn.welch@collabora.co.uk>
---

v2: - Correct spelling issues in cover letter.

 drivers/ata/ahci_imx.c | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/drivers/ata/ahci_imx.c b/drivers/ata/ahci_imx.c
index 787567e..a58bcc0 100644
--- a/drivers/ata/ahci_imx.c
+++ b/drivers/ata/ahci_imx.c
@@ -230,7 +230,7 @@ static int read_adc_sum(void *dev, u16 rtune_ctl_reg, void __iomem * mmio)
 {
 	u16 adc_out_reg, read_sum;
 	u32 index, read_attempt;
-	const u32 attempt_limit = 100;
+	const u32 attempt_limit = 200;
 
 	imx_phy_reg_addressing(SATA_PHY_CR_CLOCK_RTUNE_CTL, mmio);
 	imx_phy_reg_write(rtune_ctl_reg, mmio);
-- 
1.8.3.1

Re: [PATCH v2] ahci: imx: Handle increased read failures for IMX53 temperature sensor in low frequency mode.

[Tejun Heo]

On Mon, Nov 13, 2017 at 10:31:01AM +0000, Martyn Welch wrote:
> From: Egor Starkov <egor.starkov@ge.com>
> 
> Extended testing has shown that the imx ahci driver sometimes requires
> more than the 100 attempts currently alotted in the driver to perform a
> successful temperature reading when running at minimum (throttled) CPU
> frequency.
> 
> Debugging suggests that the read cycle can take 160 attempts (which given
> that the driver averages 80 readings from the ADC equates to one failure
> on each read).
> 
> Increase the attempt limit to 200 in order to greatly reduce the
> likelihood of the driver failing to perform a temperature reading,
> especially at low CPU frequency.
> 
> Signed-off-by: Egor Starkov <egor.starkov@ge.com>
> Signed-off-by: Martyn Welch <martyn.welch@collabora.co.uk>

Applied to libata/for-4.15.

Thanks.

-- 
tejun