From: Vignesh R <vigneshr@ti.com>
To: Jonathan Cameron <jic23@kernel.org>
Cc: Hartmut Knaack <knaack.h@gmx.de>,
Lars-Peter Clausen <lars@metafoo.de>,
Peter Meerwald-Stadler <pmeerw@pmeerw.net>,
Lee Jones <lee.jones@linaro.org>, Vignesh R <vigneshr@ti.com>,
<linux-iio@vger.kernel.org>, <linux-omap@vger.kernel.org>,
<linux-kernel@vger.kernel.org>
Subject: [PATCH 2/2] iio: adc: ti_am335x_tscadc: Improve accuracy of measurement
Date: Mon, 19 Nov 2018 12:12:36 +0530 [thread overview]
Message-ID: <20181119064236.28902-3-vigneshr@ti.com> (raw)
In-Reply-To: <20181119064236.28902-1-vigneshr@ti.com>
When performing single ended measurements with TSCADC, its recommended
to set negative input (SEL_INM_SWC_3_0) of ADC step to ADC's VREFN in the
corresponding STEP_CONFIGx register.
Also, the positive(SEL_RFP_SWC_2_0) and negative(SEL_RFM_SWC_1_0)
reference voltage for ADC step needs to be set to VREFP and VREFN
respectively in STEP_CONFIGx register.
Without these changes, there may be variation of as much as ~2% in the
ADC's digital output which is bad for precise measurement.
Signed-off-by: Vignesh R <vigneshr@ti.com>
---
drivers/iio/adc/ti_am335x_adc.c | 5 ++++-
include/linux/mfd/ti_am335x_tscadc.h | 4 ++++
2 files changed, 8 insertions(+), 1 deletion(-)
diff --git a/drivers/iio/adc/ti_am335x_adc.c b/drivers/iio/adc/ti_am335x_adc.c
index cafb1dcadc48..9d984f2a8ba7 100644
--- a/drivers/iio/adc/ti_am335x_adc.c
+++ b/drivers/iio/adc/ti_am335x_adc.c
@@ -142,7 +142,10 @@ static void tiadc_step_config(struct iio_dev *indio_dev)
stepconfig |= STEPCONFIG_MODE_SWCNT;
tiadc_writel(adc_dev, REG_STEPCONFIG(steps),
- stepconfig | STEPCONFIG_INP(chan));
+ stepconfig | STEPCONFIG_INP(chan) |
+ STEPCONFIG_INM_ADCREFM |
+ STEPCONFIG_RFP_VREFP |
+ STEPCONFIG_RFM_VREFN);
if (adc_dev->open_delay[i] > STEPDELAY_OPEN_MASK) {
dev_warn(dev, "chan %d open delay truncating to 0x3FFFF\n",
diff --git a/include/linux/mfd/ti_am335x_tscadc.h b/include/linux/mfd/ti_am335x_tscadc.h
index b9a53e013bff..483168403ae5 100644
--- a/include/linux/mfd/ti_am335x_tscadc.h
+++ b/include/linux/mfd/ti_am335x_tscadc.h
@@ -78,6 +78,8 @@
#define STEPCONFIG_YNN BIT(8)
#define STEPCONFIG_XNP BIT(9)
#define STEPCONFIG_YPN BIT(10)
+#define STEPCONFIG_RFP(val) ((val) << 12)
+#define STEPCONFIG_RFP_VREFP (0x3 << 12)
#define STEPCONFIG_INM_MASK (0xF << 15)
#define STEPCONFIG_INM(val) ((val) << 15)
#define STEPCONFIG_INM_ADCREFM STEPCONFIG_INM(8)
@@ -86,6 +88,8 @@
#define STEPCONFIG_INP_AN4 STEPCONFIG_INP(4)
#define STEPCONFIG_INP_ADCREFM STEPCONFIG_INP(8)
#define STEPCONFIG_FIFO1 BIT(26)
+#define STEPCONFIG_RFM(val) ((val) << 23)
+#define STEPCONFIG_RFM_VREFN (0x3 << 23)
/* Delay register */
#define STEPDELAY_OPEN_MASK (0x3FFFF << 0)
--
2.19.1
WARNING: multiple messages have this Message-ID (diff)
From: Vignesh R <vigneshr@ti.com>
To: Jonathan Cameron <jic23@kernel.org>
Cc: Hartmut Knaack <knaack.h@gmx.de>,
Lars-Peter Clausen <lars@metafoo.de>,
Peter Meerwald-Stadler <pmeerw@pmeerw.net>,
Lee Jones <lee.jones@linaro.org>, Vignesh R <vigneshr@ti.com>,
linux-iio@vger.kernel.org, linux-omap@vger.kernel.org,
linux-kernel@vger.kernel.org
Subject: [PATCH 2/2] iio: adc: ti_am335x_tscadc: Improve accuracy of measurement
Date: Mon, 19 Nov 2018 12:12:36 +0530 [thread overview]
Message-ID: <20181119064236.28902-3-vigneshr@ti.com> (raw)
In-Reply-To: <20181119064236.28902-1-vigneshr@ti.com>
When performing single ended measurements with TSCADC, its recommended
to set negative input (SEL_INM_SWC_3_0) of ADC step to ADC's VREFN in the
corresponding STEP_CONFIGx register.
Also, the positive(SEL_RFP_SWC_2_0) and negative(SEL_RFM_SWC_1_0)
reference voltage for ADC step needs to be set to VREFP and VREFN
respectively in STEP_CONFIGx register.
Without these changes, there may be variation of as much as ~2% in the
ADC's digital output which is bad for precise measurement.
Signed-off-by: Vignesh R <vigneshr@ti.com>
---
drivers/iio/adc/ti_am335x_adc.c | 5 ++++-
include/linux/mfd/ti_am335x_tscadc.h | 4 ++++
2 files changed, 8 insertions(+), 1 deletion(-)
diff --git a/drivers/iio/adc/ti_am335x_adc.c b/drivers/iio/adc/ti_am335x_adc.c
index cafb1dcadc48..9d984f2a8ba7 100644
--- a/drivers/iio/adc/ti_am335x_adc.c
+++ b/drivers/iio/adc/ti_am335x_adc.c
@@ -142,7 +142,10 @@ static void tiadc_step_config(struct iio_dev *indio_dev)
stepconfig |= STEPCONFIG_MODE_SWCNT;
tiadc_writel(adc_dev, REG_STEPCONFIG(steps),
- stepconfig | STEPCONFIG_INP(chan));
+ stepconfig | STEPCONFIG_INP(chan) |
+ STEPCONFIG_INM_ADCREFM |
+ STEPCONFIG_RFP_VREFP |
+ STEPCONFIG_RFM_VREFN);
if (adc_dev->open_delay[i] > STEPDELAY_OPEN_MASK) {
dev_warn(dev, "chan %d open delay truncating to 0x3FFFF\n",
diff --git a/include/linux/mfd/ti_am335x_tscadc.h b/include/linux/mfd/ti_am335x_tscadc.h
index b9a53e013bff..483168403ae5 100644
--- a/include/linux/mfd/ti_am335x_tscadc.h
+++ b/include/linux/mfd/ti_am335x_tscadc.h
@@ -78,6 +78,8 @@
#define STEPCONFIG_YNN BIT(8)
#define STEPCONFIG_XNP BIT(9)
#define STEPCONFIG_YPN BIT(10)
+#define STEPCONFIG_RFP(val) ((val) << 12)
+#define STEPCONFIG_RFP_VREFP (0x3 << 12)
#define STEPCONFIG_INM_MASK (0xF << 15)
#define STEPCONFIG_INM(val) ((val) << 15)
#define STEPCONFIG_INM_ADCREFM STEPCONFIG_INM(8)
@@ -86,6 +88,8 @@
#define STEPCONFIG_INP_AN4 STEPCONFIG_INP(4)
#define STEPCONFIG_INP_ADCREFM STEPCONFIG_INP(8)
#define STEPCONFIG_FIFO1 BIT(26)
+#define STEPCONFIG_RFM(val) ((val) << 23)
+#define STEPCONFIG_RFM_VREFN (0x3 << 23)
/* Delay register */
#define STEPDELAY_OPEN_MASK (0x3FFFF << 0)
--
2.19.1
next prev parent reply other threads:[~2018-11-19 17:04 UTC|newest]
Thread overview: 17+ messages / expand[flat|nested] mbox.gz Atom feed top
2018-11-19 6:42 [PATCH 0/2] tscadc: Couple of fixes Vignesh R
2018-11-19 6:42 ` Vignesh R
2018-11-19 6:42 ` [PATCH 1/2] mfd: ti_am335x_tscadc: Provide unique name for child mfd cells Vignesh R
2018-11-19 6:42 ` Vignesh R
2018-11-28 9:07 ` Lee Jones
2018-11-28 9:21 ` Vignesh R
2018-11-28 9:21 ` Vignesh R
2018-11-28 11:03 ` Lee Jones
2018-11-28 11:43 ` Vignesh R
2018-11-28 11:43 ` Vignesh R
2018-11-19 6:42 ` Vignesh R [this message]
2018-11-19 6:42 ` [PATCH 2/2] iio: adc: ti_am335x_tscadc: Improve accuracy of measurement Vignesh R
2018-11-25 13:46 ` Jonathan Cameron
2018-11-25 13:46 ` Jonathan Cameron
2018-11-28 9:14 ` Lee Jones
2018-12-01 15:04 ` Jonathan Cameron
2018-12-03 7:01 ` Lee Jones
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