[PATCH] test: Drop mention of old flags in a comment

[PATCH] test: Drop mention of old flags in a comment

[Simon Glass]

A comment in test-main.c was not updated with the recent rename. Fix it.

Signed-off-by: Simon Glass <sjg@chromium.org>
---

 test/test-main.c | 12 ++++++------
 1 file changed, 6 insertions(+), 6 deletions(-)

diff --git a/test/test-main.c b/test/test-main.c
index 479dbb33b72..ed100eda847 100644
--- a/test/test-main.c
+++ b/test/test-main.c
@@ -294,27 +294,27 @@ static int test_pre_run(struct unit_test_state *uts, struct unit_test *test)
 	 * Remove any USB keyboard, so that we can add and remove USB devices
 	 * in tests.
 	 *
-	 * For UT_TESTF_DM tests, the old driver model state is saved and
+	 * For UTF_DM tests, the old driver model state is saved and
 	 * restored across each test. Within in each test there is therefore a
 	 * new driver model state, which means that any USB keyboard device in
 	 * stdio points to the old state.
 	 *
-	 * This is fine in most cases. But if a non-UT_TESTF_DM test starts up
+	 * This is fine in most cases. But if a non-UTF_DM test starts up
 	 * USB (thus creating a stdio record pointing to the USB keyboard
 	 * device) then when the test finishes, the new driver model state is
 	 * freed, meaning that there is now a stale pointer in stdio.
 	 *
-	 * This means that any future UT_TESTF_DM test which uses stdin will
+	 * This means that any future UTF_DM test which uses stdin will
 	 * cause the console system to call tstc() on the stale device pointer,
 	 * causing a crash.
 	 *
-	 * We don't want to fix this by enabling UT_TESTF_DM for all tests as
+	 * We don't want to fix this by enabling UTF_DM for all tests as
 	 * this causes other problems. For example, bootflow_efi relies on
 	 * U-Boot going through a proper init - without that we don't have the
 	 * TCG measurement working and get an error
 	 * 'tcg2 measurement fails(0x8000000000000007)'. Once we tidy up how EFI
 	 * runs tests (e.g. get rid of all the restarting of U-Boot) we could
-	 * potentially make the bootstd tests set UT_TESTF_DM, but other tests
+	 * potentially make the bootstd tests set UTF_DM, but other tests
 	 * might do the same thing.
 	 *
 	 * We could add a test flag to declare that USB is being used, but that
@@ -323,7 +323,7 @@ static int test_pre_run(struct unit_test_state *uts, struct unit_test *test)
 	 * pointers always.
 	 *
 	 * So just remove any USB keyboards from the console tables. This allows
-	 * UT_TESTF_DM and non-UT_TESTF_DM tests to coexist happily.
+	 * UTF_DM and non-UTF_DM tests to coexist happily.
 	 */
 	usb_kbd_remove_for_test();
 
-- 
2.34.1

Re: [PATCH] test: Drop mention of old flags in a comment

[Mattijs Korpershoek]

Hi Simon,

Thank you for the patch.

On lun., oct. 14, 2024 at 14:17, Simon Glass <sjg@chromium.org> wrote:

> A comment in test-main.c was not updated with the recent rename. Fix it.
>
> Signed-off-by: Simon Glass <sjg@chromium.org>

Reviewed-by: Mattijs Korpershoek <mkorpershoek@baylibre.com>

> ---
>
>  test/test-main.c | 12 ++++++------
>  1 file changed, 6 insertions(+), 6 deletions(-)
>
> diff --git a/test/test-main.c b/test/test-main.c
> index 479dbb33b72..ed100eda847 100644
> --- a/test/test-main.c
> +++ b/test/test-main.c
> @@ -294,27 +294,27 @@ static int test_pre_run(struct unit_test_state *uts, struct unit_test *test)
>  	 * Remove any USB keyboard, so that we can add and remove USB devices
>  	 * in tests.
>  	 *
> -	 * For UT_TESTF_DM tests, the old driver model state is saved and
> +	 * For UTF_DM tests, the old driver model state is saved and
>  	 * restored across each test. Within in each test there is therefore a
>  	 * new driver model state, which means that any USB keyboard device in
>  	 * stdio points to the old state.
>  	 *
> -	 * This is fine in most cases. But if a non-UT_TESTF_DM test starts up
> +	 * This is fine in most cases. But if a non-UTF_DM test starts up
>  	 * USB (thus creating a stdio record pointing to the USB keyboard
>  	 * device) then when the test finishes, the new driver model state is
>  	 * freed, meaning that there is now a stale pointer in stdio.
>  	 *
> -	 * This means that any future UT_TESTF_DM test which uses stdin will
> +	 * This means that any future UTF_DM test which uses stdin will
>  	 * cause the console system to call tstc() on the stale device pointer,
>  	 * causing a crash.
>  	 *
> -	 * We don't want to fix this by enabling UT_TESTF_DM for all tests as
> +	 * We don't want to fix this by enabling UTF_DM for all tests as
>  	 * this causes other problems. For example, bootflow_efi relies on
>  	 * U-Boot going through a proper init - without that we don't have the
>  	 * TCG measurement working and get an error
>  	 * 'tcg2 measurement fails(0x8000000000000007)'. Once we tidy up how EFI
>  	 * runs tests (e.g. get rid of all the restarting of U-Boot) we could
> -	 * potentially make the bootstd tests set UT_TESTF_DM, but other tests
> +	 * potentially make the bootstd tests set UTF_DM, but other tests
>  	 * might do the same thing.
>  	 *
>  	 * We could add a test flag to declare that USB is being used, but that
> @@ -323,7 +323,7 @@ static int test_pre_run(struct unit_test_state *uts, struct unit_test *test)
>  	 * pointers always.
>  	 *
>  	 * So just remove any USB keyboards from the console tables. This allows
> -	 * UT_TESTF_DM and non-UT_TESTF_DM tests to coexist happily.
> +	 * UTF_DM and non-UTF_DM tests to coexist happily.
>  	 */
>  	usb_kbd_remove_for_test();
>  
> -- 
> 2.34.1

Re: [PATCH] test: Drop mention of old flags in a comment

[Tom Rini]

On Mon, 14 Oct 2024 14:17:53 -0600, Simon Glass wrote:

> A comment in test-main.c was not updated with the recent rename. Fix it.
> 
> 

Applied to u-boot/master, thanks!

-- 
Tom