Re: [igt-dev] [PATCH i-g-t] tests/i915_pm_dc: Increase timeout and poll interval

[Anshuamn Gupta <anshuman.gupta@intel.com>]

On 2019-10-23 at 22:10:02 +0300, Imre Deak wrote:
> The eDP panel power cycle delay prevents DC entry after a full modeset,
> which makes the test fail on some panels. Let's increase the timeout to
> take into account that delay (atm in the worst case the power cycle
> delay is 3 seconds) and also increase the polling interval to give more
> time for the device to enter a low power state.
IMHO how about exposing the panel_power_cycle_delay delay too in i915_panel_timings
attribute which can used by the igt to wait for time which is required.
It can save some time for IGT ?
i915_panel_timings has already exposing the other panel timings for debug purpose. 
> 
> Cc: Anshuman Gupta <anshuman.gupta@intel.com>
> Signed-off-by: Imre Deak <imre.deak@intel.com>
> ---
>  tests/i915/i915_pm_dc.c | 2 +-
>  1 file changed, 1 insertion(+), 1 deletion(-)
> 
> diff --git a/tests/i915/i915_pm_dc.c b/tests/i915/i915_pm_dc.c
> index ce3319b7..ef96a86e 100644
> --- a/tests/i915/i915_pm_dc.c
> +++ b/tests/i915/i915_pm_dc.c
> @@ -153,7 +153,7 @@ static uint32_t read_dc_counter(uint32_t drm_fd, int dc_flag)
>  static bool dc_state_wait_entry(int drm_fd, int dc_flag, int prev_dc_count)
>  {
>  	return igt_wait(read_dc_counter(drm_fd, dc_flag) >
> -			prev_dc_count, 3000, 100);
> +			prev_dc_count, 6000, 1000);
>  }
>  
>  static void check_dc_counter(int drm_fd, int dc_flag, uint32_t prev_dc_count)
> -- 
> 2.17.1
> 
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