[Intel-gfx] [PATCH i-g-t v2 3/3] tests/gem_lmem_swapping: reduce the timeout

[Matthew Auld <matthew.auld@intel.com>]

300s is way too much for some BAT test. Drop it down to 45s.

Signed-off-by: Matthew Auld <matthew.auld@intel.com>
Cc: Thomas Hellström <thomas.hellstrom@linux.intel.com>
Cc: Nirmoy Das <nirmoy.das@linux.intel.com>
Reviewed-by: Thomas Hellström <thomas.hellstrom@linux.intel.com>
---
 tests/i915/gem_lmem_swapping.c | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/tests/i915/gem_lmem_swapping.c b/tests/i915/gem_lmem_swapping.c
index 526835cc..31644bcd 100644
--- a/tests/i915/gem_lmem_swapping.c
+++ b/tests/i915/gem_lmem_swapping.c
@@ -219,7 +219,7 @@ static void __do_evict(int i915,
 	 * For TEST_MULTI runs, make each object counts a loop to
 	 * avoid excessive run times.
 	 */
-	for (l = 0; l < params->loops && igt_seconds_elapsed(&t) < 300; l += num) {
+	for (l = 0; l < params->loops && igt_seconds_elapsed(&t) < 45; l += num) {
 		unsigned int idx = rand() % params->count;
 
 		num = params->flags & TEST_MULTI ? rand() % max_swap_in + 1 : 1;
-- 
2.34.1