Re: [PATCH 1/2] iio: adc: ad4695: implement triggered buffer

["Nuno Sá" <noname.nuno@gmail.com>]

On Mon, 2024-08-12 at 12:03 -0500, David Lechner wrote:
> On 8/10/24 4:35 AM, Jonathan Cameron wrote:
> > On Wed,  7 Aug 2024 15:02:10 -0500
> > David Lechner <dlechner@baylibre.com> wrote:
> > 
> > > This implements buffered reads for the ad4695 driver using the typical
> > > triggered buffer implementation, including adding a soft timestamp
> > > channel.
> > > 
> > > The chip has 4 different modes for doing conversions. The driver is
> > > using the advanced sequencer mode since that is the only mode that
> > > allows individual configuration of all aspects each channel (e.g.
> > > bipolar config currently and oversampling to be added in the future).
> > > 
> > > Signed-off-by: David Lechner <dlechner@baylibre.com>
> > 
> > Main thing in here is I think you can use available_scan_masks
> > to avoid the need for the error path on just the temperature channel
> > being enabled.
> > 
> I had not thought about doing it that way, but now that I am
> thinking about it, it seems like we would need to have a scan
> mask in the list for every possible combination of channels.
> This would be 10s of thousands of possible scan masks for 16
> channel chips so that doesn't seem like the best way to go.
> 
> But adding some special handling to make the temperature
> channel just work should be easy enough to add.
> 

Not sure if the following is meaningful to this usecase but I used to think like you
but then realized that iio_scan_mask_match() will do bitmap_subset(). So you only
need to enable a subset of the available scan mask for things to work (and with that
you should no longer need an insane number of combinations). The core will then take
care of demuxing the actual enabled channels. AFAIR, strict scan matching is only
used for HW buffering.

- Nuno Sá