* patch "usb: misc: usbtest: fix pattern tests for scatterlists." added to usb-next
@ 2016-05-03 23:23 gregkh
0 siblings, 0 replies; only message in thread
From: gregkh @ 2016-05-03 23:23 UTC (permalink / raw)
To: mathias.nyman, felipe.balbi, gregkh, stable, stern
This is a note to let you know that I've just added the patch titled
usb: misc: usbtest: fix pattern tests for scatterlists.
to my usb git tree which can be found at
git://git.kernel.org/pub/scm/linux/kernel/git/gregkh/usb.git
in the usb-next branch.
The patch will show up in the next release of the linux-next tree
(usually sometime within the next 24 hours during the week.)
The patch will also be merged in the next major kernel release
during the merge window.
If you have any questions about this process, please let me know.
>From cdc77c82a8286b1181b81b6e5ef60c8e83ded7bc Mon Sep 17 00:00:00 2001
From: Mathias Nyman <mathias.nyman@linux.intel.com>
Date: Mon, 2 May 2016 11:39:03 +0300
Subject: usb: misc: usbtest: fix pattern tests for scatterlists.
The current implemenentation restart the sent pattern for each entry in
the sg list. The receiving end expects a continuous pattern, and test
will fail unless scatterilst entries happen to be aligned with the
pattern
Fix this by calculating the pattern byte based on total sent size
instead of just the current sg entry.
Signed-off-by: Mathias Nyman <mathias.nyman@linux.intel.com>
Fixes: 8b5249019352 ("[PATCH] USB: usbtest: scatterlist OUT data pattern testing")
Cc: <stable@vger.kernel.org> # v2.6.18+
Acked-by: Felipe Balbi <felipe.balbi@linux.intel.com>
Acked-by: Alan Stern <stern@rowland.harvard.edu>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
---
drivers/usb/misc/usbtest.c | 4 +++-
1 file changed, 3 insertions(+), 1 deletion(-)
diff --git a/drivers/usb/misc/usbtest.c b/drivers/usb/misc/usbtest.c
index de485d8a5beb..6b978f04b8d7 100644
--- a/drivers/usb/misc/usbtest.c
+++ b/drivers/usb/misc/usbtest.c
@@ -532,6 +532,7 @@ static struct scatterlist *
alloc_sglist(int nents, int max, int vary, struct usbtest_dev *dev, int pipe)
{
struct scatterlist *sg;
+ unsigned int n_size = 0;
unsigned i;
unsigned size = max;
unsigned maxpacket =
@@ -564,7 +565,8 @@ alloc_sglist(int nents, int max, int vary, struct usbtest_dev *dev, int pipe)
break;
case 1:
for (j = 0; j < size; j++)
- *buf++ = (u8) ((j % maxpacket) % 63);
+ *buf++ = (u8) (((j + n_size) % maxpacket) % 63);
+ n_size += size;
break;
}
--
2.8.2
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2016-05-03 23:23 patch "usb: misc: usbtest: fix pattern tests for scatterlists." added to usb-next gregkh
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